Agilent Technologies 20ET manual

1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
148
149
150
151
152
153
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
181
182
183
184
185
186
187
188
189
190
191
192
193
194
195
196
197
198
199
200
201
202
203
204
205
206
207
208
209
210
211
212
213
214
215
216
217
218
219
220
221
222
223
224
225
226
227
228
229
230
231
232
233
234
235
236
237
238
239
240
241
242
243
244
245
246
247
248
249
250
251
252
253
254
255
256
257
258
259
260
261
262
263
264
265
266
267
268
269
270
271
272
273
274
275
276
277
278
279
280
281
282
283
284
285
286
287
288
289
290
291
292
293
294
295
296
297
298
299
300
301
302
303
304
305
306
307
308
309
310
311
312
313
314
315
316
317
318
319
320
321
322
323
324
325
326
327
328
329
330
331
332
333
334
335
336
337
338
339
340
341
342
343
344
345
346
347
348
349
350
351
352
353
354
355
356
357
358
359
360
361
362
363
364
365
366
367
368
369
370
371
372
373
374
375
376
377
378
379
380
381
382
383
384
385
386
387
388
389
390
391
392
393
394
395
396
397
398
399
400
401
402
403
404
405
406
407
408
409
410
411
412
413
414
415
416
417
418
419
420
421
422
423
424
425
426
427
428
429
430
431
432
433
434
435
436
437
438
439
440
441
442
443
444
445
446
447
448
449
450
451
452
453
454
455
456
457
458
459
460
461
462
463
464
465
466
467
468
469
470
471
472
473
474
475
476
477
478

Ir para a página of

Bom manual de uso

As regras impõem ao revendedor a obrigação de fornecer ao comprador o manual com o produto Agilent Technologies 20ET. A falta de manual ou informações incorretas fornecidas ao consumidor são a base de uma queixa por não conformidade do produto com o contrato. De acordo com a lei, pode anexar o manual em uma outra forma de que em papel, o que é frequentemente utilizado, anexando uma forma gráfica ou manual electrónicoAgilent Technologies 20ET vídeos instrutivos para os usuários. A condição é uma forma legível e compreensível.

O que é a instrução?

A palavra vem do latim "Instructio" ou instruir. Portanto, no manual Agilent Technologies 20ET você pode encontrar uma descrição das fases do processo. O objetivo do manual é instruir, facilitar o arranque, a utilização do equipamento ou a execução de determinadas tarefas. O manual é uma coleção de informações sobre o objeto / serviço, um guia.

Infelizmente, pequenos usuários tomam o tempo para ler o manual Agilent Technologies 20ET, e um bom manual não só permite conhecer uma série de funcionalidades adicionais do dispositivo, mas evita a formação da maioria das falhas.

Então, o que deve conter o manual perfeito?

Primeiro, o manual Agilent Technologies 20ET deve conte:
- dados técnicos do dispositivo Agilent Technologies 20ET
- nome do fabricante e ano de fabricação do dispositivo Agilent Technologies 20ET
- instruções de utilização, regulação e manutenção do dispositivo Agilent Technologies 20ET
- sinais de segurança e certificados que comprovam a conformidade com as normas pertinentes

Por que você não ler manuais?

Normalmente, isso é devido à falta de tempo e à certeza quanto à funcionalidade específica do dispositivo adquirido. Infelizmente, a mesma ligação e o arranque Agilent Technologies 20ET não são suficientes. O manual contém uma série de orientações sobre funcionalidades específicas, a segurança, os métodos de manutenção (mesmo sobre produtos que devem ser usados), possíveis defeitos Agilent Technologies 20ET e formas de resolver problemas comuns durante o uso. No final, no manual podemos encontrar as coordenadas do serviço Agilent Technologies na ausência da eficácia das soluções propostas. Atualmente, muito apreciados são manuais na forma de animações interessantes e vídeos de instrução que de uma forma melhor do que o o folheto falam ao usuário. Este tipo de manual é a chance que o usuário percorrer todo o vídeo instrutivo, sem ignorar especificações e descrições técnicas complicadas Agilent Technologies 20ET, como para a versão papel.

Por que ler manuais?

Primeiro de tudo, contem a resposta sobre a construção, as possibilidades do dispositivo Agilent Technologies 20ET, uso dos acessórios individuais e uma gama de informações para desfrutar plenamente todos os recursos e facilidades.

Após a compra bem sucedida de um equipamento / dispositivo, é bom ter um momento para se familiarizar com cada parte do manual Agilent Technologies 20ET. Atualmente, são cuidadosamente preparados e traduzidos para sejam não só compreensíveis para os usuários, mas para cumprir a sua função básica de informação

Índice do manual

  • Página 1

    User ’s G uide Ag ilent T ech no logies 8719E T/20ET/22 ET 8 719ES/20 ES/22 ES Netw ork An alyzer s P art Nu mber : 0 872 0-90 392 Pr inte d in USA J u ne 2002 Sup e rse de s : F ebr uary 20 01 © Copyr i ght 1999–2 0 0 2 Agi lent T ec hnologies , Inc .[...]

  • Página 2

    ii Notic e The i nf ormation conta ined in t hi s document is s ubject to change wit hout notice . Agilent T echnolog ies makes no w arranty of any kind with r egard to this material, inc luding but not limited to , the i mplied w arranties of m erchantabil ity and fitnes s for a partic ular purpose . Agilent T echnolog i es shal l not be lia b le [...]

  • Página 3

    iii S afety N ote s The following safety notes are used throughout this m anual. F a mil iari ze yourse lf with each of the notes a nd its meaning before operat ing this instr ument. All p ertinent s afety notes for using this p r oduct ar e located in Cha p ter 8 , “Safety and Regulatory In form atio n.” W ARNING W arning d enotes a h azard . [...]

  • Página 4

    iv Docu me ntation M ap The Installa tion an d Qu ick S tart Gu id e provides proc ed ures for installing , c onfiguring , a nd verifyi ng the oper a tion of the analyzer . It also will hel p you f a m iliariz e yourself wi th the basi c operati on of the a nalyz er . The User’s Gu id e shows how to make meas ur ements , explains commonly-used f [...]

  • Página 5

    Contents Contents-v 1. Making Mea surements Usi n g Thi s Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-2 More Instr ument Fu nctions Not De scrib ed in This Gu ide . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-3 Maki ng a Bas ic Me asurement . . . . . . . . .[...]

  • Página 6

    Contents-vi Contents Usi ng Li mit Lin es to T est a D evice. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-72 Set t ing Up the Mea suremen t P arameter s . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 -72 Cre a ting Flat Limit Lines . . . . . . . . . . . . . . . . . . . . . .[...]

  • Página 7

    Contents Contents-vii P erformi ng a P ower Met er (S ource) Ca libra tion Over the RF Ra nge . . . . . . . . . . . . . . . . 2-15 Sett ing th e Anal y zer to Make a n R Chann el Meas u rement . . . . . . . . . . . . . . . . . . . . . . . .2-17 High Dynamic Ra nge Swept R F/IF Con vers i on Loss . . . . . . . . . . . . . . . . . . . . . . . . . . .[...]

  • Página 8

    Contents-viii Contents 4. Pri ntin g, P lott i ng, an d Sa vi ng M ea sur eme nt R e sul t s Usi ng This Chapt er . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4- 2 Pri nting or Plot ting Y our Measure ment Re s ult s . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [...]

  • Página 9

    Contents Contents-ix What Y ou Can Save to the A nal yzer’ s Inter nal Memor y . . . . . . . . . . . . . . . . . . . . . . . . . . 4-36 What Y ou Ca n Sav e to a Floppy Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-37 What Y ou Ca n Sav e to a Compute r . . . . . . . . . . . . . . . . . . . . . . . . . .[...]

  • Página 10

    Contents-x Contents Inc reasi ng Dynami c Rang e . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5- 15 Incr ease t he T est P ort Input Po wer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-15 Reduce the Rece i ver Nois e Fl oor . . . . . . . . . . . . . . . [...]

  • Página 11

    Contents Contents-xi Mat ched Adapters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6 - 4 5 Modif y th e Cal Ki t Thru Defin itio n . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-46 Mini mizing Er ror Wh en Usi ng Adapter s . . . . . . . . . .[...]

  • Página 12

    Contents-xii Contents Swep t Lis t Fr equency Sweep (H z) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-17 P ow er S weep (dBm) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-19 CW Ti m e Swe ep (Sec onds) . . . . . . . . . . . . . . . . . . .[...]

  • Página 13

    Contents Contents-xiii The TRL Cali brati on Proc edure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-7 2 GPIB O perati on . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7- 78 Loc al Key . . . . . . . . . . . . . . . . . . . . . . [...]

  • Página 14

    Contents-xiv Contents[...]

  • Página 15

    1-1 1 Maki ng Measur ement s[...]

  • Página 16

    1-2 Making Measurements Using This C hapter Using This C hapter This cha pter contai ns the foll owing example proc edures for making m ea surements . Mi xer and ti me domain measurement s are cov ered in Chapter 2 , "Ma king Mixer Measurements (Opt io n 08 9 Onl y)" and Chapter 3 , “Making Ti m e Domain Measurement s.” This ch apt e [...]

  • Página 17

    1- 3 Making Measur ements More I nstrument Fun ctions Not Described in This Guide More Inst rument Funct ions Not Describ ed in This Gui de T o learn abo ut instrument func tions not c overed in this user’ s guide , refer to the follow ing chapters in the refer ence guide . “Menu Maps” contai ns maps of the in strument me nu struct u re . “[...]

  • Página 18

    1-4 Making Measurements Making a Basic Measur ement Making a Basic Meas urement There are f ive basic s teps when you are m aking a measurement. 1. Connect the d evice und er test a nd any requi r ed test eq uipment. CA UTI ON Damage m ay result t o the devic e under test (DUT ) if i t i s sensitive to the analyzer’ s default output power level. [...]

  • Página 19

    1- 5 Making Measur ements Making a Basi c Measurement Set ting the Frequen cy R ange T o s e t the center frequency to 134 MH z, press: T o set the span to 3 0 MHz, press: NO TE Y ou could al so press the and keys and e nter the fr equency range limi ts as start f requency and s top frequenc y values . Sett ing th e So urce P owe r T o c ha nge the[...]

  • Página 20

    1-6 Making Measurements Making a Basic Measur ement Step 5. Outpu t the measurement results . T o create a p rinted co p y of the measurement result s, p ress: (or ) Refer to Chapt er 4 , “Printi ng , Plotting , and Saving Measurement Results ,” for procedure s on how to set up a pri nter and defi ne a print, p lot, or save resul ts. Cop y PR I[...]

  • Página 21

    1- 7 Making Measur ements Measuring Magnitud e and Insertion P hase Response Mea su ring M agnitude an d Insertion Pha se Response This measurement ex amp le shows y ou how to meas ure the maximum amplitud e of a surface a coustic w ave (SA W ) filter a nd then how to view th e m easurement data in the phase for m at, which p rovides i nformation a[...]

  • Página 22

    1-8 Making Measurements Measuring Magni tude and Inser ti on Phase Response If the channels a r e coupled ( the default condition), this calib r ation is valid for b oth channels . 4. Reconnect your t est device. 5. T o better v iew the measurement tr a ce, press: 6. T o locate the maximum amp l it ude of the device respons e, as shown in Figu re 1[...]

  • Página 23

    1- 9 Making Measur ements Measuring Magnitud e and Insertion P hase Response Fi gure 1-4 E xample Insert ion Phase Re sponse M easurement The phase r esponse shown in Figu r e 1 -5 is undersample d ; that i s, t here is m ore than 18 0 ° phase del ay between fr equency points . If the ∆Φ ≥ 18 0 ° , incorrec t phase and del ay in fo rm atio n[...]

  • Página 24

    1-10 Making Measurements Using Di splay Funct ions Using Display Functions This sec tion provi d es the neces sary informatio n for using the displa y functions . These functio ns are ver y helpful for displayi ng measurement data so tha t it wil l be easy to r ead. This sec tion covers the following top i cs: • Adding titl es to your m ea sureme[...]

  • Página 25

    1- 11 Making Measur ements Using Displa y Functions Titling the Active Channel Display 1. Press to a ccess the title menu. 2. Press and enter the title y ou want for your measurement d isplay . • If you ha ve a DIN keyboard at tached to the analyzer , type the ti tle you want from the keyboard. Then p ress to enter the title i nto the a na lyzer [...]

  • Página 26

    1-12 Making Measurements Using Di splay Funct ions Viewing Both Primary Measurement Channels In s om e cases , you may want to view more than one measured parameter a t a time . Simulta neous gain and pha se measurements , for e xample, are us eful in evaluating stabili ty in negati ve feedback a m plifi er s. Y ou can ea sily make such measurement[...]

  • Página 27

    1- 13 Making Measur ements Using Displa y Functions Fi gure 1-8 Example Dual C hannel with Split Display On 3. T o re tu rn t o a sing le-g rati cul e d isp la y , p re ss : . NO TE Y ou can contr ol the sti m ulus funct ions of the tw o channels i ndependent of each other by pressing . Dual Channel Mod e w it h Decoupl e d Stimulus The stimulus f [...]

  • Página 28

    1-14 Making Measurements Using Di splay Funct ions However , there ar e two config ur ations tha t w ill no t sweep continuousl y . 1. F or analyzer s with source attenuators , with c hannel 1 ha ving one attenua tion value and channel 2 set to a diff er ent at tenua tion v alue , then conti nuous s weep is disa bl ed to avoid wear on the attenuato[...]

  • Página 29

    1- 15 Making Measur ements Using Displa y Functions Figure 1 -9 Th ree-C han nel Di splay 4. Press Chan 4 ( or press , set to O N ). This en ables channel 4 and the screen now displays f our separate g rids as show n in Figu re 1-1 0 . Channel 4 is i n the lower -right quadr a nt of the s creen. Chan 2 AUX C HA N[...]

  • Página 30

    1-16 Making Measurements Using Di splay Funct ions Figur e 1-1 0 F our -C hann el Dis p lay 5. P ress . Observe that th e a mber LED adjacen t to the key is l it and the CH4 indicator on the dis play has a box around i t. This indica tes that cha nnel 4 is no w active and c an be configured. 6. P ress . Markers 1 and 2 appear on all four channel tr[...]

  • Página 31

    1- 17 Making Measur ements Using Displa y Functions Once made active , a channel c an be confi gured independentl y of the other channel s in most variables except stim ulus. F or example , once channel 3 is active , you c an change its for mat to a Smith chart by p ressing . Customizing th e F our-C hannel Display When one or b oth auxili ary chan[...]

  • Página 32

    1-18 Making Measurements Using Di splay Funct ions 4 P aram Disp lays S oft ke y The menu does two thing s : • provides a quick wa y to s et up a four -parameter disp lay • gives inf ormation for usi ng softkeys i n the menu Figu re 1-1 1 show s the f i rst screen. Si x setup opti ons are de s cribed with softkeys through . is a four -parameter[...]

  • Página 33

    1- 19 Making Measur ements Using Displa y Functions Using Memory T races and Memory Math Functions The analyzer has four a vailable memory tr aces , one p er channel. Memo ry traces are t otally channel dep endent: c ha nnel 1 cannot access the c hannel 2 memory trace or v ice versa. Memory trac es can be sa ved with i ns trument states : one memor[...]

  • Página 34

    1-20 Making Measurements Using Di splay Funct ions T o V iew th e Measure me nt Dat a and Mem ory Trace The anal y zer default s etting s how s you t he current measureme nt data for the active channel . 1. T o view a data trace that you have alrea dy stored to the active c hannel memory , press: This is the only memory dis play mode wher e you can[...]

  • Página 35

    1- 21 Making Measur ements Using Displa y Functions Blanking the Display Pressing switches off the analyze r display while leav ing the instr um ent in i ts current measur ement state . This fea ture may be helpful in p rol ongi ng the life of the LCD in ap pl ic a tions where the analyzer is left unattended ( such as i n an automated tes t system)[...]

  • Página 36

    1-22 Making Measurements Using Di splay Funct ions Adjusting the Colors of the Display Setting Display Intensity T o adjust the intensi ty of the disp lay , pr ess and rotate the f ro nt panel knob , us e the ( ) ( ) keys , or use the numeric al keyp ad to s et the intensity value between 50 and 1 00 per cent . L owering the intensity may p rolong [...]

  • Página 37

    1- 23 Making Measur ements Using Displa y Functions NO TE Ma ximum viewi ng with the LCD displa y is achieve d when primary color s or a combination o f t hem are sel ec ted at ful l brig htnes s ( 100%). T abl e 1-2 lists the recommended color s and thei r correspondi ng tint numbers . Color is comprised of thr ee parameters: • Tin t : T he cont[...]

  • Página 38

    1-24 Making Measurements Using Marker s Using Markers The key disp lays a m ov able activ e marker on the screen and p r ovides ac c ess to a serie s of menus to control up to five displa y m arkers for each channe l. M ark ers are used to obtain numerical rea d ings of m easured values . They also p r ovide capabil ities for reducing measurement t[...]

  • Página 39

    1- 25 Making Measur ements Using Markers NO TE U sin g wil l als o af fect mar ke r sea rch and positi oning functions w hen the v a lue enter ed in a s earch or position ing function does not exist a s a measurement p oint. The marke r will be positioned to the clos est adjacent p oint that sa tisfies the s e arch o r po si tion in g va lu e. T o [...]

  • Página 40

    1-26 Making Measurements Using Marker s Fi gu re 1-13 Active and Inactive Mark e r s E xamp le • T o switch of f all of t he m arkers , press . T o Mo ve Marker Inform ation Off the Grids If m a rker info rmation obscures th e display traces , you c an turn off the softke y menu and move t he m arker infor ma tion of f the displ ay traces and int[...]

  • Página 41

    1- 27 Making Measur ements Using Markers Figure 1 -14 M arker In forma t ion M o ved int o the S oftk ey Menu Are a 4. Restore the s oftkey menu and move the marker inf or mation back onto the gra ticules: Pre ss . The di splay wi ll be sim ilar t o Fig ure 1-1 5 . pg654e[...]

  • Página 42

    1-28 Making Measurements Using Marker s Fi gu re 1-15 Marker Informati on on the Gratic u les Y ou ca n also restore the s of tkey menu by pressi ng a hardkey which opens a menu (such as ) or p ressing a sof tkey . T o Us e Delta ( ∆ ) Markers This i s a relati ve mode, whe re the marker v alues show the position of the acti v e marker rel ative [...]

  • Página 43

    1- 29 Making Measur ements Using Markers Figure 1 -16 M arker 1 a s the Referen ce M arker E xam ple 4. T o c hang e the reference marker to mark er 2, p res s : T o Activate a Fixed Mar ker When a ref er ence marker i s fixed, it does not rely on a c urrent t r ace to m a intain i ts fixed position. T his is c onv enient when comp aring tw o diffe[...]

  • Página 44

    1-30 Making Measurements Using Marker s Fi gu re 1-17 Exampl e of a Fixed Reference Marker Using MKR ZE RO Using the Key to Activate a F ixe d Referen c e Marker 1. T o set the freq uenc y val ue of a fi xed mar ke r t hat appe ars on the a nalyze r di spl a y , p r ess: a nd turn the front pa nel knob, o r enter a va l ue from the front panel keyp[...]

  • Página 45

    1- 31 Making Measur ements Using Markers Fi gu re 1-18 Example of a Fixe d Reference Marke r Using ( ∆ )REF=( ∆ )FIXED MK R T o Couple and Uncouple Display Markers At a preset state , the markers ha ve the sa m e stimulus val ues on eac h channel, but they can be uncoup led so that each channe l has independent markers . Press and selec t from [...]

  • Página 46

    1-32 Making Measurements Using Marker s T o Us e P olar F ormat Markers The anal yzer can dis play the mar ker value as magnitude and phas e, or as a real/i maginary pa ir: gi ves l ine ar ma gnit ude a nd p hase , gi ves l og mag nit ude and phase , gives the r eal value fi r st, then the imaginary value. Y ou can use thes e markers only whe n you[...]

  • Página 47

    1- 33 Making Measur ements Using Markers T o Use Smith Chart Markers F or greater a ccuracy when us ing markers in t he Smith c hart format, a ctivate the discrete mark er mo de. Pres s . T o use Smit h chart f ormat: 1. Pre ss . 2. Press and tur n the fro nt panel knob , or enter a value from the f ront panel keypad to read the resisti ve and reac[...]

  • Página 48

    1-34 Making Measurements Using Marker s Fi gu re 1-21 Exampl e of Impedance Smith C hart M ar k ers T o Set Measur ement P a rameters Using Ma rkers The anal y zer allows you to set m ea surement parameter s with the m arkers , without g oi ng throug h the usual key s equence . Y ou c a n change c er tain sti mulus and resp onse parameters to make [...]

  • Página 49

    1- 35 Making Measur ements Using Markers Setting the Stop Frequency 1. Press a nd turn the f ront panel knob , or enter a value fro m the front panel keypad to p osition the m arker at the va lue t ha t you w a nt for the stop fr eq uency . 2. Press to change the stop freq uenc y value to the value of t he active mark er . Fi gure 1-23 Example of S[...]

  • Página 50

    1-36 Making Measurements Using Marker s Fi gu re 1-24 Exampl e of Setting the Center Frequency Using a Marker Setting the F re quency Span Y ou can set the span equal to the spacin g between two markers . If yo u set the ce nter frequency before you s et the fr eq uency span, you will ha ve a bette r view of t he area of inter est. 1. P ress . 2. T[...]

  • Página 51

    1- 37 Making Measur ements Using Markers Figure 1 -25 Exam ple of Set ting the Frequen cy Span Using Mar k er Set ting the Display Refer ence V alue 1. Press a nd turn the f ront panel knob , or enter a value fro m the front panel keypad to p osition the m arker at the va lue t ha t you w a nt for the analyzer di s play refere nc e v alue. 2. Press[...]

  • Página 52

    1-38 Making Measurements Using Marker s 1. P ress . 2. Press and t urn the fr ont p anel knob , or enter a val ue from the fr ont panel keypad to p osition the marker a t a poi nt of interes t. 3. Press to a utomatically a dd or subt r act enough l ine length to the receiver i nput to co m pensate for t he phase slope a t the acti ve marker positio[...]

  • Página 53

    1- 39 Making Measur ements Using Markers T o Search for a Specific Amplitude These f unc tions place the marker a t an ampli tude-related point o n the t race. I f you s witch on t rack ing, the analyz er searches ev ery new trace for the ta r get point. Searching for the Maximum Amplitude 1. Press to a ccess the m arker search menu. 2. Press to mo[...]

  • Página 54

    1-40 Making Measurements Using Marker s Fi gure 1-29 Example of Searching for the M in imum Amplitu d e Using a Marker Searching f or a T arget A mplitude 1. Press to a ccess the m a rker searc h m enu. 2. Press to mov e the active m a rker to t he target poi nt on the measurement tra c e. 3. If y ou want to change the ta rget amplitude v alue (def[...]

  • Página 55

    1- 41 Making Measur ements Using Markers Searching for a Bandwidth The analyzer can automatical ly calcula te and display the bandwidth (BW :), center frequency ( CENT:) , Q, and loss of the device und er test at the center f requency . ( Q stands for “quali ty factor ,” def i ned as the ratio of a circuit's resonant f r equency to i ts ba[...]

  • Página 56

    1-42 Making Measurements Using Marker s T o Calculate the Statistics of the Measurement Data This func tion calc ulates the mean, s tandard devi a tion, and p eak -to-pea k values o f the secti on of the displa yed trace between the activ e mark er and t he delta referenc e. If there is no delta reference , the a na lyzer ca l culates t he statisti[...]

  • Página 57

    1- 43 Making Measur ements Measuring Electrical Length and Ph ase Distortion Mea su ring E lectrical Length an d Phase Distor tion Elec trical L eng th The analyzer mathematically implements a func ti on simila r to the m echa nica l “line stretc hers” of ea r lier analy zers. This feature simulates a v ariable l ength lossless transmission l i[...]

  • Página 58

    1-44 Making Measurements Measuring Electri cal Length and P hase Disto rtion Y ou ma y also w ant to se lect setting s for the num b er of data p oints , a v eraging , and I F bandwidth. 3. Substitute a thru f or the dev i ce and perfor m a response c alibration b y pressing : 4. Reconnect your t est device. 5. T o better v iew the measurement tr a[...]

  • Página 59

    1- 45 Making Measur ements Measuring Electrical Length and Ph ase Distortion The measur em ent value tha t the ana lyzer displa y s repres ents the electr ical leng th of your d ev ice relati ve to the speed of lig ht in free space . The p hysical leng th of your dev ice is related to this value by the propagation velo city of its medium. NO TE V e[...]

  • Página 60

    1-46 Making Measurements Measuring Electri cal Length and P hase Disto rtion Deviati on F rom Line ar Phase By adding electric a l length to “flatten out ” the phase respo ns e, y ou have removed the line ar phase shift through y our device . T he deviati on from l inear phase shif t throug h your devic e is all that remains . 1. F ollow the pr[...]

  • Página 61

    1- 47 Making Measur ements Measuring Electrical Length and Ph ase Distortion The default apertur e is the total f requency span divided by the number of points across the display (i.e. 201 points or 0.5% of the total s p an in thi s example). 1. Continue with the same instrument settings and m easurements as i n the pr evious proce d ure, “Deviat[...]

  • Página 62

    1-48 Making Measurements Measuring Electri cal Length and P hase Disto rtion Fi gu re 1-38 Group Delay Example Measurement wit h Smoothing 5. T o increase the ef fective gr oup delay aperture , by incre asing the number of measurement poi nts over whic h the analyzer calculates the group dela y , press: As the ap er ture is i ncreased the “ s moo[...]

  • Página 63

    1- 49 Making Measur ements Characterizing a D uplexer (ES Anal yz ers On ly) Ch ara cterizin g a Duplexer (E S Analyz ers Only) This measurement ex amp le demons tr ates how to characteri ze a 3-port d ev ice , in this case a duplexer , using f our- parameter di s play mod e. Y o u must use a t est adapter or a speci a l 3-port tes t adapter t o ro[...]

  • Página 64

    1-50 Making Measurements Characterizi ng a Duple xer (ES A nalyzers Onl y) 3. Set up cha nnel 1 f or the Tx - Ant stim ulus para meters ( st art/stop f r equency , power level, IF bandwidth ). In t his example , a wide f requency range t hat cover s both the Tx-Ant a nd Ant-Rx paramete rs has been c hosen. 4. Uncouple the primary channel s from eac[...]

  • Página 65

    1- 51 Making Measur ements Characterizing a D uplexer (ES Anal yz ers On ly) 15.Set up a 2-gratic ule, 4 -parameter dis p lay with tr ansmission meas ur ements on the top grati c ule and r ef lecti on m easurements on the bottom gra ticule: Pre ss , then s et to . The di splay wi ll be sim ilar t o Fig ure 1-4 1 . Figure 1 -41 Dup lexer M easu rem [...]

  • Página 66

    1-52 Making Measurements Measuring Ampl if iers Measur in g Amplifi ers The anal y zer allows you to measure the transmissi on and reflec ti on chara c teristics of many ampli fier s and a c tive d ev ic es . Y ou can meas ure scala r parameter s s uc h a s ga in, gain fl atness, gain com p res sion, r everse iso lation, retur n loss (SWR), and gai[...]

  • Página 67

    1- 53 Making Measur ements Measuring Ampli fi er s Measuring Gain Compr ession Gain compress i on occurs w hen the inp ut power of an am plifier is increased to a level t hat reduces the gain of the a mplifier and causes a nonl i near increa s e in output power . The point at which the gain is reduced b y 1 dB is c a lled the 1 dB compressi on poin[...]

  • Página 68

    1-54 Making Measurements Measuring Ampl if iers 4. T o produce a nor m alized tra ce that repres ents gain compr ession, perfor m either step 5 or step 6 . (Step 5 uses trace ma th and ste p 6 uses uncoup led channels and the di s play function .) 5. Press to p r oduce a normali zed trace . 6. T o produce a nor m alized tra ce, pe r form the f ollo[...]

  • Página 69

    1- 55 Making Measur ements Measuring Ampli fi er s Fi gure 1-44 Gain Compression Using Linear Sweep and 12.If w a s selected , recouple the channel stimulus by press ing: 13.T o place t he marker exact ly on a measurement point, press: 14.T o set the CW frequency bef ore going int o the power s w eep mode, press: 15.Pr ess . If interpolation i s on[...]

  • Página 70

    1-56 Making Measurements Measuring Ampl if iers NO TE A receiver c alibration w ill improve the a ccuracy of thi s measurement. Ref er to Chapter 6 , “Cal ibrating f or Increased Mea surement Ac c uracy .” 22. Pre ss . 23.T o find t he 1 dB compressio n point on c hannel 1, p r ess: Notice t hat the marker on channel 2 t r acked the m arker on [...]

  • Página 71

    1- 57 Making Measur ements Measuring Ampli fi er s Measuring Gain and Reverse Isolation Simultaneously (ES Analyzers Only) Since a n amplifie r will ha v e high g ain in the fo rward dir ec t io n an d h ig h isol atio n in the reverse d irection, the gain (S 21 ) will b e much grea ter than the r everse isol ation (S 12 ). Therefore , the power yo[...]

  • Página 72

    1-58 Making Measurements Measuring Ampl if iers Fi gu re 1-46 Gain and Reverse Isolat ion[...]

  • Página 73

    1- 59 Making Measur ements Measuring Ampli fi er s Making High P ower Measuremen ts with Option 085 (ES Analyzers Only) Analyzers eq ui pped with Opt ion 085 can b e configured t o m easure high p ower devices . This abilit y i s useful if the requir ed input p ower f or a devi ce under test i s greater than the analyzer c an provide , or if the ma[...]

  • Página 74

    1-60 Making Measurements Measuring Ampl if iers 5. Switch on the booster amplifier . 6. Using a pow er meter , measure the output power from the coupled ar m and the open port of the coupler . NO TE Depending on the power meter being us ed, addit iona l attenuation may ha ve to be added between the c oupler port a nd the power m eter . 7. V erify t[...]

  • Página 75

    1- 61 Making Measur ements Measuring Ampli fi er s Fi gure 1-48 High P ower T est Setup (Step 2a) Fi gure 1-49 High P ower T est Setup (Step 2b ) Selec ting P ow er Ran ges and Att enu ator Setting s 14.Selec t a p ow er r a nge that will not exc eed the maximum estim a ted power l evel t hat will force the DUT into com p ression. F or example , if[...]

  • Página 76

    1-62 Making Measurements Measuring Ampl if iers 16.Estimate the maxi m um amount of gain that could be provided b y the DUT and, a s a result, the maximum amount of p ower that c ould be recei ved by TEST PORT 2 wh en the DUT is in compressio n. F or example , if a DUT w ith a maxi m um gain of +10 dB receives an i nput of + 20 dBm, then the m axim[...]

  • Página 77

    1- 63 Making Measur ements Measuring Ampli fi er s Wi th the previous poin ts in mind, t he amount of attenua ti on can be calcul a ted f rom the fol lowing equations: • Attenuator A = +20 dBm − 13 dB − ( − 10 d Bm). At tenuator A = +1 7 dB • Attenuator B = +30 dBm − 13 dB − ( − 10 dBm) . Attenuator B = +27 dB 18.Set the int ernal s[...]

  • Página 78

    1-64 Making Measurements Measuring Ampl if iers Fi gu re 1-51 High P ower T est Setup (Step 3) 26.Make any other desired high p ow er measurement s. Ratio measurement s suc h a s gain w i ll be c orrectly displayed . However , the displaye d absolute p ow er levels on the analyzer will not b e correct. T o correctly interpret powe r levels , the ga[...]

  • Página 79

    1- 65 Making Measur ements Measuring Ampli fi er s Making High P ower Measuremen ts with Option 012 (ES Analyzers Only) Analyzers eq ui pped with Opt ion 012 can b e configured t o m easure devi c es that have high power outputs . With direct sampler access , you can insert attenuator s between the couplers a nd samplers , protec ting the sampler s[...]

  • Página 80

    1-66 Making Measurements Measuring Ampl if iers With the p re vious points i n mind , the a mount of att enuation c a n be ca lc ul ated f r om the following equati ons : • Attenuator v a lue = +2 0 dBm − 13 dB − ( − 10 dBm). A tten ua tor V a lue = +17 dB 3. Choose the S2 1 measurement p arameter by p ressing . 4. Connect the attenuator be[...]

  • Página 81

    1- 67 Making Measur ements Using the Swept List M ode to T est a De vice Using t he Swept List Mode to T est a Dev ice When using a l ist frequenc y sweep, the analyzer has the abili ty to sweep a rbitrary frequency seg ments, each co nta ining a l ist of freq uency points . One major advanta ge of using lis t frequency sweep is that i t allows you[...]

  • Página 82

    1-68 Making Measurements Using the Swept Li st Mode t o T est a Devi ce 2. Set the f ollowing meas ur ement parameters: or on ET model s: Observe the Characteristics of the F ilter Fi gu re 1-55 Characteristics of a Fi lter • Generally , the passband of a fil ter exhibits l ow loss. A relative ly low incident powe r m ay be needed to avoid o verd[...]

  • Página 83

    1- 69 Making Measur ements Using the Swept List M ode to T est a De vice Set Up the Lower Stopband P arameters 3. T o set up the segment f or the l ow er stopband, press 4. T o maximize the dynamic rang e in the sto p band (increa sing the inc i dent power and narrowing the IF b and width), press until ON is selected until ON is selected Set Up the[...]

  • Página 84

    1-70 Making Measurements Using the Swept Li st Mode t o T est a Devi ce 8. T o maximize the dynami c range i n the stopband (increasing t he incident p ow er and narrowing t he IF bandwidth) , press: 9. P ress . Calibrate and Measure 1. Remove the D UT and perform a ful l two-por t calibration. Refer to Chapt er 6 , “Calibrat ing for Inc r eased [...]

  • Página 85

    1- 71 Making Measur ements Using the Swept List M ode to T est a De vice Fi gure 1-57 Fil ter M easurements Using Linear Sweep and Swept List Mode (P ower: 0 dBm/I F BW : 3700 Hz) Using Linea r Sweep Using Swept Li st Mode[...]

  • Página 86

    1-72 Making Measurements Using Limit Lin es to T est a D evi ce Using Lim it Li nes to T est a Dev ice Limit testi ng is a measur ement technique that compa res m eas urement data to constraints that y ou define. Depending on the results of this c om parison, the analyzer will indicate i f your d evice eit her passes or f ails the test. Limit testi[...]

  • Página 87

    1- 73 Making Measur ements Using Limi t Lines to T est a Device 3. Substitute a thr u for the device and per form a response c alibration by pressing: 4. Reconnect your test device . 5. T o bett er view the m eas ur ement trace , pr ess: Creating Flat Limit Lines In this ex ample proc ed ure, the following flat limit line values are set: NO TE T he[...]

  • Página 88

    1-74 Making Measurements Using Limit Lin es to T est a D evi ce 5. T o terminate the flat l i ne segment by establishing a single poi nt limit, p r ess: Figu re 1-59 shows the f lat limi t lines that you have just creat ed with the f ollowing parameters: • stim ulu s fr om 1 27 M Hz to 14 0 M H z • upper limit of − 21 d B • lower limit of ?[...]

  • Página 89

    1- 75 Making Measur ements Using Limi t Lines to T est a Device • T o crea te a limit line that t es ts the hi g h side of the bandpass f ilter , press: Fi gure 1-60 Example F lat Limit Lines Creating a Sloping Limit Line This example procedur e shows you how to make limits that test the shap e factor of a SA W filter . The f ollowing li mits are[...]

  • Página 90

    1-76 Making Measurements Using Limit Lin es to T est a D evi ce 1. T o access the limits menu a nd activate the limit li nes, press: 2. T o establi s h the start f r eque ncy a nd l imits f or a s l oping limit li ne that t es ts the low s ide of the fi lter , press: 3. T o terminate the lines and c reate a s loping limi t line, press: 4. T o estab[...]

  • Página 91

    1- 77 Making Measur ements Using Limi t Lines to T est a Device Fi gure 1-61 Sloping Limit Lines Creating Sing le P oint Limits In this ex ample proc ed ure, the following limits ar e set: • from − 23 d B to − 28 .5 dB at 14 1 MH z • from − 23 dB to − 28 . 5 dB at 12 6.5 M H z 1. T o acce s s the lim its menu and acti vate the limit l i[...]

  • Página 92

    1-78 Making Measurements Using Limit Lin es to T est a D evi ce Fi gu re 1-62 Exampl e S i n gle P oints Limit Line Editing Limit Segments This e xa mple shows you how to edit the upper lim it of a li m it line . 1. T o access the limits menu a nd activate the limit li nes, press: 2. T o move the point er symbol (> ) on the a nalyzer d i splay t[...]

  • Página 93

    1- 79 Making Measur ements Using Limi t Lines to T est a Device Running a Limit T est 1. T o acce s s the lim its menu and acti vate the limit l ines , press: Reviewing the Limit Line Segments The limit ta ble data tha t you ha ve previousl y entered is shown on the anal yzer display . • T o verify that eac h segment in y our limits ta ble is c o[...]

  • Página 94

    1-80 Making Measurements Using Limit Lin es to T est a D evi ce 1. T o offset a ll of the segm ents in the limit ta ble by a fi xed frequency , (for ex a mple, 3 M H z ), pre ss: The analy ze r bee ps an d a FAIL n otation appears on the analyzer displa y , as shown in Figu re 1-63 . Fi gu re 1-63 Exampl e S t imul us Offset of Limit Lines • T o [...]

  • Página 95

    1- 81 Making Measur ements Using Ripple Limits to T est a Device Usin g Ripple Limit s to T est a Device Setting Up the List of Ripple Limits to T es t Two tasks ar e involved in p reparing f or ripple t esting: • First, s et up the a na lyzer setti ng s to v iew the freq uenc y of i nterest. • S econd, s et up the a nalyzer to t est over the a[...]

  • Página 96

    1-82 Making Measurements Using Rippl e Limits to T est a Device Fi gu re 1-65 Conne ctions for an Example Ripple T e st Measurement 2. Press and c hoose the measurement s ettings . F or this example , the measurement sett ings are as follows: • or on ET model s: • • • Y ou ma y also w ant to se lect setting s for the num b er of data p oint[...]

  • Página 97

    1- 83 Making Measur ements Using Ripple Limits to T est a Device Fi gure 1-66 Filt e r P ass Band Before Ripple T est Setting Up Limits for Ripple T esting This sect ion instructs you on setti ng up the r ipple test parameters. Y ou must s et up the analyzer to c hec k the D U T at the c orrect f requencies and c ompare the measured v alues against[...]

  • Página 98

    1-84 Making Measurements Using Rippl e Limits to T est a Device 1. T o access the ripple te s t menu, press: 2. T o access the ripple te s t edit m enu, press . 3. Add the f i rst fr eq uency band ( Frequency Band 1 ) to be tes ted by press ing . 4. Set the l ower frequency value of F requency Band 1 b y pressing: 5. Set the up per frequenc y value[...]

  • Página 99

    1- 85 Making Measur ements Using Ripple Limits to T est a Device 3. Mak e the cha ng es to the selected b a nd by press i ng: a. and the new value t o change the l ower frequency of the frequency b a nd. b . and the new value to cha nge the upper frequency of t he frequency b a nd. c . and the new decibel va lue to change t he maximum allow able ri[...]

  • Página 100

    1-86 Making Measurements Using Rippl e Limits to T est a Device Dele ting Exis ting Freq uency B and s Frequ ency band limits m ay be del eted for testi ng the ripp le. This procedure g uides you throug h deleting ex isting freq uenc y band lim i ts. Y ou may delete indi vidual frequenc y bands or delete all of the f r equency band s from the l ist[...]

  • Página 101

    1- 87 Making Measur ements Using Ripple Limits to T est a Device Fi gure 1-67 Filt e r P assband with Ripple T e st Activat e d As the analyze r measures the ripple, a message is di splayed ind i cating whe ther the measurement passes or fails : • If the ripp le test pas s es, a RIPL n PA S S message (where n = the channel number ) is displ ayed [...]

  • Página 102

    1-88 Making Measurements Using Rippl e Limits to T est a Device • If the r ipple t est fails , the ripple limits a re drawn on the displa y for each f requency band. Wit hin each f requency band, the lower ripp le limit is d rawn at the l owest point o n the measured trace and the upper ripple limit is d r awn at the user -speci f ied maximum rip[...]

  • Página 103

    1- 89 Making Measur ements Using Ripple Limits to T est a Device T o di splay t h e rippl e va lue, press . Pressin g this soft ke y tog gle s between , , and . from the Ripple T est Menu until ON is display ed on the softkey . Pressing this s oftkey toggle s the anal y zer between r ipple test o n and rippl e test off sta tus. When the Absolute an[...]

  • Página 104

    1-90 Making Measurements Using Rippl e Limits to T est a Device Fi gu re 1-69 Filter P ass B and with Absolute Ripple V alue for Band 1 Activated View ing the Ripple V alue in Margin Format When is select ed, the mar gi n by whic h the r ipp le v alue p assed or fa iled is d isplayed. The ripple v alue margin i s the user -defined m aximum ripple m[...]

  • Página 105

    1- 91 Making Measur ements Using Ripple Limits to T est a Device Figu re 1-70 shows the r ipple test with margin r ipple value d isplaye d for Fr equency Band 2. Notic e that Frequ ency Band 2 passes t he ripple test with a ma rgin of 0.097 dB . The plus s i gn ( + ) indicates thi s band p asses the ri pple test b y the amount displayed. A minus si[...]

  • Página 106

    1-92 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter Usi ng Bandwi dth Li m it s to T est a B andpass Fi lter The bandwid th testing mode c an be used to test the ba nd width of a bandpass filt er . The bandwidth te st finds the p eak of a signal i n the passband a nd locate s a point o n each s i de of t he passband at a n[...]

  • Página 107

    1- 93 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Fi gure 1-72 Connections for a Bandp ass Filter Example Measu reme nt 2. Press and choo s e the measur em ent setti ngs. F or this exa m ple, the measurement setti ngs are as fol low s: a. or o n ET models: b. c. d. Y ou may also w a nt to sel ec t setti ngs for the num[...]

  • Página 108

    1-94 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter 3. Substitute a thru f or the dev i ce and perfor m a response c alibration b y pressing : 4. Reconnect your t est device. Refer to Figure 1- 73 . Setting Up the Bandwidth Limits When you s e t up the b andwidth limits to test the b andpas s filter , you w ill set • the[...]

  • Página 109

    1- 95 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Activating the Bandwidth T est 1. Start the band w idth test b y pressing the s of tkey until ON is displaye d. The bandwid th test co ntinues to run unti l the softkey is ret ur ned to the OF F position. The test display s a message i n the upper left co r ner of t he [...]

  • Página 110

    1-96 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter Fi gu re 1-75 Band widt h Markers Placed 40 dB Below the Bandpass P eak Displa yin g the B andw idth V alue 1. Display the bandwidth v a lue by pres s ing the softkey until ON is dis p layed on the softkey . When this sof tkey i s set t o the ON positi on, the meas ured b[...]

  • Página 111

    1- 97 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Fi gure 1-76 Filt e r P ass Band with Bandwid th V alue Displayed[...]

  • Página 112

    1-98 Making Measurements Using T est Sequencing Using T est Sequencing T est se quenci ng a llows you to automate r ep eti ti ve tasks . As you m ake a m easur ement, the analyzer m emorizes the key strokes . Later you can repea t the enti re sequence b y pressing a singl e key . Because the sequence is defined wit h normal measurement keystr okes,[...]

  • Página 113

    1- 99 Making Measur ements Using T est Sequenci ng Figure 1 -77 T e st Seq uencing He lp Ins truction s 2. T o selec t a sequence p osition in w hich to stor e your sequence , pres s: This cho i ce select s sequence posi tion #1. The d efault ti tle is SE Q1 for this sequence. Refer t o "Changing the Seq ue nce Titl e" on page 1-103 f or [...]

  • Página 114

    1-100 Making Measurements Using T est Sequencing The previous key strokes wi ll create a displayed l ist as show n: Start of Sequence RECALL PRST STAT E Tran s: FWD S 21 (B/ R) LOG M AG CENTER 13 4 M/u SP AN 50 M/u SC AL E/DIV A UTO S CAL E 4. T o complete the sequence creat ion, press: CA UTI ON When y ou create a sequence, the analy z er s tores [...]

  • Página 115

    1- 101 Making Measur ements Using T est Sequenci ng 3. T o move the c ursor to the command that yo u w ish to d elete, press: or • If you wi sh to scroll through the s equence wit hout executing each line as you do so , yo u can pr ess the key an d scroll thro ug h t he com m an d l ist ba ckward s. • If you us e the key to m ov e the cur sor t[...]

  • Página 116

    1-102 Making Measurements Using T est Sequencing The foll ow ing li s t is the c ommands entered i n "Creating a Sequence" on page 1-98 . Notice t hat for long er sequences , only a po r tion of the list c an appear on the screen at one time . Star t of Se qu ence RECA LL PRST S TATE Tran s: FWD S2 1 (B /R ) LOG MA G CENT ER 13 4 M/u SPAN[...]

  • Página 117

    1- 103 Making Measur ements Using T est Sequenci ng Changing the Sequence T itle If y ou are storing s equences on a disk, you should replac e the default titles (SEQ1, SEQ2, …) . 1. T o selec t a sequence tha t you wa nt to retit le, p ress: and s elect the p articul a r sequence s oftkey . The anal y zer shows the availab le title cha racters .[...]

  • Página 118

    1-104 Making Measurements Using T est Sequencing Storing a Sequence on a Disk 1. T o fo rm at a di sk, re fe r t o Chapter 4 , “Printing , Plotting , and Sav ing Measurement Results .” 2. T o save a s equence to the interna l disk, press: and selec t the parti cular sequence s oftkey . The disk d r ive acc es s light s hould turn on briefly . W[...]

  • Página 119

    1- 105 Making Measur ements Using T est Sequenci ng Printing a Sequence 1. Confi g ure a compat ible printer to the analyzer . (Refer to th e “Options and Ac cessories” chap ter of the reference guid e.) 2. T o pri nt a sequence, p ress : and the sof tkey for the d esired sequenc e. NO TE If the sequence i s on a di sk, load the sequence (a s d[...]

  • Página 120

    1-106 Making Measurements Using T est Sequencing Comm an ds Th at R equi re a C lean Swee p Many fr ont panel commands di s rupt the s weep in progres s, f or example , changing the channel or measurement type . W hen the analyze r does execu te a disrupti ve comma nd i n a sequenc e, some instrument funct ions are inhib ited until a complete swee [...]

  • Página 121

    1- 107 Making Measur ements Using T est Sequenci ng NO TE P resetting the instrument does no t run the Auto Seq uence automatical ly . Gosub Sequence Command The softkey , l oc ated in the Sequencing menu, activates a feature that all ows the sequence to branch of f to anot her sequence , then r eturn to the or iginal sequence . F or example, you c[...]

  • Página 122

    1-108 Making Measurements Using T est Sequencing The TESTSET I/O bits are set using the and keys under the key s . The v alues of the outputs (pins 1 1, 22, a nd 23) are des cri be d in T a ble 1- 5 . The value c hanges wit h the test por t, so if the ex ternal cont r ol is r equired for both test port direc tions , the setti ngs must be made under[...]

  • Página 123

    1- 109 Making Measur ements Using T est Sequenci ng Electrica l specifi c ations f or TTL high: • vol ts(H) ≥ 2. 7 v olt s (V ) • current = 2 0 microamps ( µ A) Electrica l specifi c ations f or TTL low: • vol ts(L) ≤ 0. 4 vo lt s (V) • curr en t = 0. 2 m ill ia mp s (m A) Figure 1 -78 P ar allel P o rt Inpu t and Ou tp ut Bu s Pin Loc[...]

  • Página 124

    1-110 Making Measurements Using T est Sequencing T e st Set Inter co nnec t Cont rol Fi gu re 1-79 T est Set Interconnect Pi n Designations Control of the ext er nal swi tch (8762B Option T24) can be d one through the test set inter face on the r ear panel of the analyzer . Pin 2 2 (TTL 1) on t he TEST SET -I /O INTERCONNECT connector i s a TTL lin[...]

  • Página 125

    1- 111 Making Measur ements Using T est Sequenci ng T able 1-5 T est Set Interconnect Pin Designation Pin Num ber Pin Desc ri ptio n Pin 1 No Connec tion (NC) Pin 2 S weep dela y: holds off sweeps unti l test set ha s finished swee ping (85046A/ B and 85047B only ) Pin 3 Sam e as T est Sequence (TTL OUT) output BNC connect or Pin 4 NC Pin 5 NC Pin [...]

  • Página 126

    1-112 Making Measurements Using T est Sequencing TTL Out Menu The softkey provides acc ess to the TTL out menu. This m enu allows you to choos e between the f ollowing output parameters of the TTL o utput signal: • • • • The TTL outp ut signals ar e sent to the s equencing BNC rear panel output. Sequencing Special Functions Menu This menu i[...]

  • Página 127

    1- 113 Making Measur ements Using T est Sequenci ng Loop counter decision making The anal y zer ha s a numeric r egister c alled a l oop counter . The value of this r egister ca n be set by a s equence , and it can b e incriminated or decremented ea ch ti me a sequence repeats itself . The decisi on making commands and jump to a nother sequenc e if[...]

  • Página 128

    1-114 Making Measurements Using T est Sequencing t o T est a Devi ce Using T est Sequencing t o T est a Device T est se quenci ng a llows you to automate r ep eti ti ve tasks . As you m ake a m easur ement, the analyzer m emorizes the key strokes . Later you can repea t the enti re sequence b y pressing a singl e key . This sec tion conta i ns the [...]

  • Página 129

    1- 115 Making Measur ements Using T est Sequenci ng to T est a Device The fol lowing seque nc es will be created: SEQUE NCE SEQ1 Start of Se que nc e CENTE R 134 M /u SPAN 50 M/u DO SEQUE NCE SEQUE NCE 2 SEQUE NCE SEQ2 Start of Se que nc e Trans :FW D S 21 (B /R) LOG M AG SCALE /DIV AUTO SCA LE Y ou can ex tend t hi s process of calling the nex t s[...]

  • Página 130

    1-116 Making Measurements Using T est Sequencing t o T est a Devi ce T o create a second sequence that will perform a d esi re d measurement function, decre m ent the loop counter , and call i tself until the loop counte r value is equal to zero, press: or o n ET models: This wil l create a displayed l ist as show n: SEQUE NCE LOOP 2 Start of Se qu[...]

  • Página 131

    1- 117 Making Measur ements Using T est Sequenci ng to T est a Device This will c reate the f ollowing di s played l ists: Start of Sequence LOOP COUNTER 7 x1 INTERNAL DISK DATA ONLY ON DO SEQUENCE SEQUENCE 2 Start of Sequence FILE NAME DT[LOOP] PLOT NAME PL[LOOP] SINGLE SAVE FILE 0 PLOT DECR LOOP COUNTER IF LOOP COUNTER <> 0 THEN DO SEQUENCE[...]

  • Página 132

    1-118 Making Measurements Using T est Sequencing t o T est a Devi ce • The plot fi le names gene r ated by th is sequence will be: PL00007.FP through PL00001.FP T o run the sequence, pr e ss: Limit T est Exam ple Seq uence This measur em ent example s hows you how to create a seque nc e that will branch t he sequenc e a ccording to the outc om e [...]

  • Página 133

    1- 119 Making Measur ements Using T est Sequenci ng to T est a Device This wil l create a displayed l ist for seq uence 2, a s shown: Start of Se que nc e INTER NAL DI SK DATA ARR AY ON FILEN AME FILE 0 SAVE FIL E 3. T o crea te a sequence that prompts you to tune a device t hat has fa iled the li mit test, and cal ls sequence 1 to retest the devic[...]

  • Página 134

    1-120 Making Measurements Using T est Sequencing t o T est a Devi ce[...]

  • Página 135

    2-1 2 Ma king Mixe r M easur ement s (Optio n 089 Only)[...]

  • Página 136

    2-2 Making Mix er Measurements (Option 089 Only) Using This C hapter Using This C hapter This cha pter contai ns the foll owing: • Information on mixer measuremen t capabiliti es. • Information on mixer measuremen t considerations . • Example proced ur es for m a king the foll ow ing mixer m easurements: — Conversion los s using the f reque[...]

  • Página 137

    2- 3 Making Mixer Measurements (Option 089 Only) Mixer Measur ement Capabili ties Mixer Measurement Capab ilit ies The analyzer is capable o f measuring t he following m ixer (frequenc y converter ) parameters: F igu re 2-1 M ixe r P arameters • Tr ansmission c haracteristi cs incl ude conversion loss, conversion comp ression, g roup dela y , and[...]

  • Página 138

    2-4 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Measurement Cons iderations In mixer transmission meas ur ements , you ha ve RF and LO inputs a nd an IF outp ut. Also emanati ng f rom the IF port are several other mixing products of the RF and L O signals . In mixer mea s urements , leakage signals from one m ixer por[...]

  • Página 139

    2- 5 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Fi gu re 2-2 Conversion Loss versus Output F re quency without At ten uat ors at Mixer P orts Fi gu re 2-3 Examp le of Conversion Loss versus Output F reque ncy with Attenuation at All Mi xer P orts Reducing the Effect of Spurious Responses By cho os ing test f requencies[...]

  • Página 140

    2-6 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Eliminating Unwanted Mixing and Leakage Signals By pla c ing fil ters between t he m ixer’s IF port and the receiver’s input por t, you can eli mi nate unw a nted mixing a nd leakage si g nals from e ntering the ana lyzer’s rec eiver . Fi ltering is r equired in bo[...]

  • Página 141

    2- 7 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Fi gu re 2-5 Examp le of Conversion Loss versus Output F reque ncy with Correct IF Signal P ath Filterin g an d Attenuat ion at All Mixer P orts How RF and IF Are Defined When you choos e between and in t he frequency offset menus , the analyzer d etermines whic h directi[...]

  • Página 142

    2-8 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Figure 2 -6 Exam ples of U p C onvert ers a nd Dow n Co nverte r s In s ta ndard mixer m easurements , the i np ut of the mixer is al ways c onnected t o the analyzer’ s RF source , and the output of the mixer alw a ys produc es the IF frequenci es that are r eceived b[...]

  • Página 143

    2- 9 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Figu re 2-7 D own Con ver ter P o rt Co nnec tion s • In an up co nv erter measur em ent where the softkey is selected , the notati on on the setup d iagram indica tes that the a nalyzer's source fr eq uency is l abeled IF , connecting to the mixe r IF port , and t[...]

  • Página 144

    2-10 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Frequ ency offset meas urements do no t begin until all of the f requency off set mode parameters are set. Thes e include the following : • Start and S top IF F requencies • LO frequency • Up Converter / Down Converter • RF > LO / RF < LO The LO fr equency[...]

  • Página 145

    2- 11 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Setting the power r a nge to manual prevents the i nternal sour c e attenuato r from switchi ng when changi ng power level s. I f you cho ose a diff er ent power rang e, t he R channel offs et c ompensa tio n a nd R channel m easurement c ha nges by the a mount of the at[...]

  • Página 146

    2-12 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons 6. Y ou ca nnot trust R c hannel power se ttings without know ing about the offset inv olved. P erform a recei ver cali b ration to r emove any power offsets by pres sing: Once completed , the R cha nnel should di s play t he reference pow er ( − 10 dBm in t h is ex a[...]

  • Página 147

    2- 13 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Convers ion Loss U sin g the Frequency Of fset Mode Conversio n loss is the m easure of ef f ic i ency of a mix er . It is the ra tio of si d e-ba nd IF power to RF sig na l power , and is us ually expr essed in dB . The mixer translates t he incomi[...]

  • Página 148

    2-14 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Setting Measurement P arameters for the P ower Meter Calibration 1. Connect the meas urement equipme nt as shown in St ep 1 of Figu re 2-11 . Figure 2 -11 Con nection s for R Ch anne l and So ur ce Calib ration CA UTI ON Note that the fr ont panel j[...]

  • Página 149

    2- 15 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode P erforming a P ower Meter (Source) Calibration Over the RF Range 1. Calibrate and zero the power m eter . 2. Set the power m eter’s a d dress: (where aa is the GPIB address of the power mete r ) 3. Select t he a ppropriate power meter by p r essi[...]

  • Página 150

    2-16 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 5. T o perform a one sweep power meter c alibration o ver the RF frequency range at 0 dBm ( − 10 d Bm fo r 8 72 2E S ), pre ss: (or on 872 2ES : ) NO TE Because power me ter c al ibrati on r eq uir es a l onger sweep ti me, you m a y w a nt to red[...]

  • Página 151

    2- 17 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Setting the Analyzer to Make an R Channel Measurement 1. Connect the equipm ent as shown in Figure 2-1 2 . Figur e 2-1 2 R -Channe l M ixer M easur em ent Equ ipmen t Set up NO TE An error message wi l l be di splayed whil e the R I n port is d isco[...]

  • Página 152

    2-18 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 4. Turn on freq uency offset op eration b y pressing . Notice in thi s high-s ide LO , down convers ion configura tion, the analy zer’s sourc e is actually s weeping b a ckwards , as shown in Fi gur e 2 -13 . The measurement s etup diag ram is sho[...]

  • Página 153

    2- 19 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 5. T o view t he conversion loss in the b est verti cal resoluti on, press . Fi gu re 2 -15 Conversion Los s Example M easurement In this measurement , you set the input power and measured the outp ut power . Fig ure 2-15 shows the a bsolute l os s [...]

  • Página 154

    2-20 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss Hig h Dynamic Ran g e Swept RF/IF Co nversion Loss The frequenc y of f set mode ena bles the testi ng of high dynamic rang e freq uenc y converter s (mixers ), by tuning the analyzer’s high dynamic r ange receiver above or below its source , by a[...]

  • Página 155

    2- 21 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Figur e 2-16 C onne ctions f or P ow er Mete r Calib ration 3. Select t he a nalyzer a s the sy s tem control ler: 4. Set the power m eter’s a d dress: (where aa is the p ow er meter GPIB a ddress) 5. Select t he a ppropriate power meter by p r ess[...]

  • Página 156

    2-22 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss NO TE Because power me ter c al ibrati on r eq uir es a l onger sweep ti me, you m a y w a nt to reduce the number of points before pressing . After the power meter cali bration is f inished, return the num ber of points to its or iginal value a nd[...]

  • Página 157

    2- 23 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Using the Mixer Measurement Diagra m While the a nalyzer is s till set to the IF f requency rang e, pres s : Note the RF frequency val ues on the diagram. Press . P erform a P ower Meter Calibration Over the RF Range 1. Connect the equipm ent as show[...]

  • Página 158

    2-24 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss P erform the High Dyna mic Range Measur ement 1. Return the analyzer to t he IF fre q uency range. Press . 2. Make the connec tions shown i n Fig ure 2- 19 3. Set the LO source to the desi red CW frequency of 1500 MHz and power level to 13 dBm. St [...]

  • Página 159

    2- 25 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Fi gu re 2-19 Conn ection s for a H igh Dynamic Range Swept IF Conversion Loss Measurement 4. Set the anal yzers LO frequenc y to match t he frequency of the LO sou r ce by press ing: 5. T o selec t the converter type and low-side LO measure m ent co[...]

  • Página 160

    2-26 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss Fi gure 2-20 Example of Swept IF Convers ion Loss Measure me nt[...]

  • Página 161

    2- 27 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Fi x ed IF Mixer Measur ements A fixed IF can be pr oduced by using b oth a swept RF a nd LO that a re offs et by a certa in frequency . With p roper fil tering , only this offset f requency wil l be present a t the IF port of the mixer . This measurement r equires two ex[...]

  • Página 162

    2-28 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements NO TE Y ou may have to cons ult the us er ’s guide of the ext er nal source being used t o determine how to set the source t o receive SCPI c ommands. 3. Be sure to connect the 10 MHz reference sig nals of the external s ourc es to the EXT R EF connector on the rear p a[...]

  • Página 163

    2- 29 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Putting the A nalyzer into Tu n ed Receiver Mod e Setting Up a Frequency List Sweep of 26 P oints P erforming a Response Calibration Input a s title: POW :LEV 6 DBM Input a s title: FREQ:MODE CW ;CW 1 00MHZ Prompting the User to Connect a Mixer to t he T est Setup Input a[...]

  • Página 164

    2-30 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements Initializ in g a Loop Counter V alue t o 2 6 Ad dres s ing a nd C onfi gurin g t he T wo Sou rc es Input as title: F REQ :MO DE CW ;CW 500MHZ;:FREQ:CW :STEP 100MHZ Input as title: P O W :LEV 13DBM Input as title: F REQ :MO DE CW ;CW 600MHZ;:FREQ:CW :STEP 100MHZ Call ing t[...]

  • Página 165

    2- 31 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements TUNE D RE CEI VE R EDIT L IST ADD CW FR EQ 100M /u NUMB ER OF P OI NTS 26x1 DONE DONE LIST F REQ B TITL E POW: LE V 6DB M PERI PH ERAL HP IB A DD R 19x1 TITL E TO PE RI PHER AL TITL E FRE Q:MODE CW;CW 10 0MHZ TITL E TO PE RI PHER AL CALI BR AT E: RE SP ON SE CAL ST AN DAR[...]

  • Página 166

    2-32 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements Sequence 2 Setup The fol lowing seque nc e makes a seri es of measurements until all 26 CW measurements are made a nd the l oop counter value is equal to zero. T his sequence i ncludes: •t a k i n g d a t a • incrementing the source f r equenci es • decrementing the[...]

  • Página 167

    2- 33 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Press and the analyzer will displ ay the foll owing sequence c omma nds: SEQU ENCE SE Q2 Star t of Sequ ence WAIT x 1 x1 MANU AL TR G ON P OINT TITL E FREQ :CW UP PERI PHERA L HPIB ADD R 19x1 TITL E TO PERI PHERAL PERI PHERA L HPIB ADD R 21x1 TITL E TO PERI PHERAL DEC R L[...]

  • Página 168

    2-34 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements When the sequen ces are fini shed you should ha ve a r es ult as show n in Figu re 2-23 . Fi gure 2-23 Example Fixed IF Mixer Measu re men t The disp layed trace represents the conversion l oss of the mixer at 26 p oints . Each poi nt corresp onds to one of the 26 diff er[...]

  • Página 169

    2- 35 Making Mixer Measurements (Option 089 Only) Phase or Gro up Delay M easurements Ph ase or Gr oup Dela y Measu rements F o r i nfo rm atio n o n gr oup de lay p rin c ipl e s, refer to "Settin g the Electri cal Delay" on page 1-37 . Phase Measure ments When you are making l inear measurem ents , you must provide a ref er ence fo r de[...]

  • Página 170

    2-36 Making Mix er Measurements (Option 089 Only) Phase or Grou p Delay M easurements An importa nt character istic to r em ember when sel ec ting a c alibrati on m ixer is that the dela y of the devi ce should b e kept as l ow as possib le. T o do this , se lect a mixer w ith very wide bandw idth (wider band w idth results in smaller delay). T he [...]

  • Página 171

    2- 37 Making Mixer Measurements (Option 089 Only) Phase or Gro up Delay M easurements Fi gu re 2-24 Connections for a Group Delay Measur e ment 6. T o selec t the converter type and a high-si d e LO measurement conf iguration, press: 7. T o view t he measurement resul ts on the a na lyzer’ s displa y , press: 8. T o selec t the format ty pe, pres[...]

  • Página 172

    2-38 Making Mix er Measurements (Option 089 Only) Phase or Grou p Delay M easurements 10.Replace the "c alibra tion" mixer w ith the dev ice under tes t. If measuring group dela y , set the dela y equal to the "calibr ation" mixer d elay (fo r example − 0.6 ns ) by pressi ng : 11.Scale the data for best verti cal resoluti on. [...]

  • Página 173

    2- 39 Making Mixer Measurements (Option 089 Only) Amplitude a nd Phase T racking Amp litude and Phase Tracking The match b etween mixers is defined as t he absolute di fference i n amplitude or p ha se response over a spec ifi ed frequ ency range . T he tr acki ng between mixers is essenti al l y how well the d evices are ma tched over a specified [...]

  • Página 174

    2-40 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode Co nv er sio n C o mp r es sio n U si ng th e Freq u enc y O ffs et Mo de Conver s ion compress ion is a measure of the maximum RF i np ut signal level where the mixer p rovides l inear operati on. The conversi on loss is t he ratio of t he I[...]

  • Página 175

    2- 41 Making Mixer Measurements (Option 089 Only) Con version Compression U sing the F r equency Of fset Mode 4. T o set the analy zer to the d esired power swe ep range, press: 5. Mak e the connec tions , as shown in F ig u re 2- 28 . CAUTI ON T o prevent connecto r damage, use an adapter (p art number 1250-1462) as a connector saver for R CHANNEL[...]

  • Página 176

    2-42 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode 8. Make the connec tions as shown in Fi gur e 2 -29 . CA UTI ON T o prevent connec tor damage, use an adap ter (part number 1 250-1462) as a connector saver for R CHANNEL IN . Figure 2 -29 Co nnection s fo r the Se cond P o r tion o f Con ver[...]

  • Página 177

    2- 43 Making Mixer Measurements (Option 089 Only) Con version Compression U sing the F r equency Of fset Mode The measurements setup diagram i s shown in Figure 2-3 0 . Fi gu re 2-30 Measu r e ment Setup Diagram Shown on Analyzer Display 12.T o view the mixer’s outp ut power as a f unc tion of its i nput power , press: 13. T o se t up a n activ e[...]

  • Página 178

    2-44 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode The measurement r esults show the mixer’s 1 dB c om pression p oint. By changing the target value , yo u can eas ily lo cate other compress ion poi nts (for example , 0. 5 dB , 3 dB). See Figure 2-31 . 15.Read the co m pressed power o n by [...]

  • Página 179

    2- 45 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements Isolatio n Examp le Measu rements Isolati on is the m easure of s ignal le a kage in a mixer . F eedthroug h is specifi c ally the f or ward signa l lea kag e to the IF po r t. High i s olatio n m eans that the amount of lea kag e or feedthrough b etween the mixer ’[...]

  • Página 180

    2-46 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents 4. Make the connec tions as shown in Fi gur e 2 -33 . Fi gure 2-33 Connections for a Response Calibrat ion 5. P erform a resp onse calibrat ion by pressi ng . NO TE A full 2-port cali bration will increase the acc uracy of isolati on measurements . Refer to Chapter [...]

  • Página 181

    2- 47 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements 7. T o adjus t the di s play sc ale, p ress: The measur em ent results show the mixer’ s LO to RF isol ation. Fi gu re 2-35 Example Mixer LO to RF Isolation Measurement RF F eedthrough The proced ur e and equi p ment configurati on necessary for this measur em ent a[...]

  • Página 182

    2-48 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents NO TE Isolatio n is dependent on L O power leve l and frequency . T o ensure good tes t result s, y ou should ch oose these pa r ameters as c lose to ac tua l opera ting condit ions as possib le. 5. Make the connec tions as shown in Fi gur e 2 -36 . Fi gure 2-36 Con[...]

  • Página 183

    2- 49 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements NO TE Y ou may see spurious responses on the anal y zer trac e due to inte rference caused by L O to IF l eakage in the m ixer . This can be r educed with a veraging or by r educing the I F bandwidth. Fi gu re 2-38 Example Mixer RF F ee dthrou gh M e asureme n t Y ou [...]

  • Página 184

    2-50 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents SWR / Return Loss Refl ect ion coeffi cient ( Γ ) is d efined as the ratio betwe en the refl ec ted volta ge (V r ) and inc ident voltage ( V i ). St a nding wav e ratio ( SWR) is def ined as the r atio of m a ximum stand ing w a ve voltage to the minim um stand in[...]

  • Página 185

    3-1 3 Ma king T i me Domai n Meas urements[...]

  • Página 186

    3-2 Making Tim e Domain Measurements Using This C hapter Using This C hapter This cha pter contai ns the foll owing: • An intro d uction to time domain measurements • Example proced ur es for m a king time domain t ransmission and r eflec ti on response measurements • Information on the f o ll owi ng time domain c oncep ts : — "Time D [...]

  • Página 187

    3- 3 Making Time D o main Measurements Intr oduction to Time D omain Measur ements Introdu ction t o Time Domain Measu rement s The analyzers with Option 010 all ow y ou to measure the time domain response of a device . Time domain a na lysis is us eful for isolating a device p roblem in ti me or i n distance . Time and dist a nce are r elated by t[...]

  • Página 188

    3-4 Making Tim e Domain Measurements Int roduction t o Time D om ain Measurements Fi gure 3-1 Device Frequency Domain and Ti me Domain Reflection R esponses The time domain measure ment shows the ef f ec t of each disc onti nuity as a function of tim e (or d i st ance) , and shows tha t the test dev ice r esponse c ons i st s of t hree separat e i [...]

  • Página 189

    3- 5 Making Time D o main Measurements Making T ransmission Response Measurements M aki ng Tr an smission R esponse Me asurem e nts In this ex ample measurement there are thr ee components of the transmissi on response: • RF leakage at ne ar zero time • the main trav el path thro ugh the device (1.6 µ s tra v el time) • the "tripl e tra[...]

  • Página 190

    3-6 Making Tim e Domain Measurements Making T ransmission Response M easurements 5. T o transform t he d ata f r om the f requenc y domai n to t he time domai n and set the sweep from 0 s to 6 µ s , press: The other ti me domain modes , low pass step and l ow pass impulse, ar e descr i bed in "Time Domain Low P ass Mode" on p age 3-15 . [...]

  • Página 191

    3- 7 Making Time D o main Measurements Making T ransmission Response Measurements 11.T o activat e the gating f unction to r em ove any unwanted responses , press: As show n i n Figu r e 3-4 , only respons e from the main path is disp layed. NO TE Y ou may remove t he displ ayed response f rom insid e the gate markers b y pressing and t urning the [...]

  • Página 192

    3-8 Making Tim e Domain Measurements Making T ransmission Response M easurements Fi gure 3-5 Gate Shape • T o see the ef fect of the gating i n the frequenc y dom ain, pre s s: This pl aces the gated response in mem ory . Fi gur e 3 -6 shows the effect of remov ing the RF leakage and the tripl e travel s ignal path usi ng gating . By transformi n[...]

  • Página 193

    3- 9 Making Time D o main Measurements Making Reflection Response Measurements Making Reflection Re sp onse Measurements The time domain response of a reflecti on measurement is o ften compared with the time domain reflect ometry ( TDR) measurements . Like the TDR, the analyzer measures the size of the ref lections v ersus time ( or dista nc e). Un[...]

  • Página 194

    3-10 Making Tim e Domain Measurements Making Reflection Response Measurements Figu re 3 -8 Devic e Re s p onse in the Frequency Domain 5. T o transform t he data from t he frequency do m a in to the time domain, p ress: 6. T o view the t ime domain over the length (<4 m eters) o f the cable under test, p ress: The stop ti me correspond s to the [...]

  • Página 195

    3- 11 Making Time D o main Measurements Making Reflection Response Measurements 8. T o positi on the marker on t he reflecti on of inter est, press : and tur n the front p anel knob, or enter a v a lue from the front panel key pad . In thi s example, the veloci ty factor w as set t o one-half the actual v alue, so the marker reads t he time and dis[...]

  • Página 196

    3-12 Making Tim e Domain Measurements Time Do m ain Bandpass Mode Ti me Doma in Bandpass Mode Thi s mo de is ca ll ed b and pass becau s e it wo rks with ban d-lim i ted de vic es. Trad it ional TD R requir es that the test device be able to op erate down to dc . Using bandpass mode , there are no restr ictions on the measurement f requency range .[...]

  • Página 197

    3- 13 Making Time D o main Measurements Time Domain B andpass Mode Fi gu re 3-10 A Re flec t ion Measu r e ment of Two Cables The ripples in reflec tion coeffi cient versus frequency in the frequency d omain measurement are caused by the reflections a t each connector "beati ng" against ea ch other . One at a t im e, loosen the c onnector[...]

  • Página 198

    3-14 Making Tim e Domain Measurements Time Do m ain Bandpass Mode Transmission Measurements Usin g Bandp ass Mode The bandp a ss mode can a l so transfo rm transmission m easurements to t he time domain. F or example, thi s m o d e can provide inf ormation about a surface acoustic w ave (SA W) filter that i s not apparent in the fre quency domain. [...]

  • Página 199

    3- 15 Making Time D o main Measurements Time Domai n Lo w Pass Mode Time Domain Low P ass M ode This mode is used to simul a te a tr a ditional time domain refl ectometry (TDR) measurement. It provides i nformati on to determine the type of disc ontinuity ( resistive , capacitiv e, or i nductive) tha t is pr esent. Low pass p r ovides t he best res[...]

  • Página 200

    3-16 Making Tim e Domain Measurements Time Do m ain Low P ass Mode Minim um Al lo wable Stop Freque ncies The lowest analyzer meas urement frequency is 5 0 MHz, ther efore for each value of n there is a minimum allowa b le stop f requency that c an be used. T hat is , the mi nimum stop fr equency = n × 50 M Hz. T a ble 3-2 lis ts the mi ni mum fre[...]

  • Página 201

    3- 17 Making Time D o main Measurements Time Domai n Lo w Pass Mode The real format can also be used in the low pass impul s e mode , but for the best dyna m i c range f or simultaneous l y viewing large and small discontinuit ies, use the log magnitude fo rmat .[...]

  • Página 202

    3-18 Making Tim e Domain Measurements Time Do m ain Low P ass Mode F ault Location Measurements Using Low P ass As desc ribed, the l ow pass mode ca n simulate t he T DR response of the tes t device. This resp ons e contains i nformation usef ul in deter mi ning the t ype of di s continuity pr esent. Figu re 3-1 3 i llustrates the low pa s s respon[...]

  • Página 203

    3- 19 Making Time D o main Measurements Time Domai n Lo w Pass Mode Fi gu re 3-14 Low P ass Step Measurements of Com mon Cable F aults (Real For m at) Transmission Measurements in Time Doma in Low P ass Measuring Sm al l Signal Transie n t Respons e Using Low P a ss S t e p Use the l ow pass mode to analyze t he test device’ s small sig na l tran[...]

  • Página 204

    3-20 Making Tim e Domain Measurements Time Do m ain Low P ass Mode Fi gure 3-15 Time Domain Low P ass M easure m ent of an Amplifier Small Signal Transient Response Interpr e tin g the Low P ass Step Transmission Respon se Horizontal Axis The low pass transmiss ion measur ement horizo ntal axis displays the a ve rage transi t ti me throug h the tes[...]

  • Página 205

    3- 21 Making Time D o main Measurements Time Domai n Lo w Pass Mode Fi gu re 3-16 Transmission Measurements Using Low P ass Impulse Mode[...]

  • Página 206

    3-22 Making Tim e Domain Measurements T ransfor ming CW Time Measurements in to the Frequenc y Domain Tr ansf orm in g CW Time Measurements int o the Frequency Domain The anal yzer can dis play the a mplitude and p has e of CW signals v ersus time . F or example, use t his mode for m easurements suc h as amplifier gain as a f unction of w armup tim[...]

  • Página 207

    3- 23 Making Time D o main Measurements T ransf or ming CW Time M easurements into the Frequen cy Domain Interpreti ng the F orward Tran sform Ho riz ont al Axis In a fr equency domain t r ansform of a CW time measureme nt, the horizont al axis is measured in uni ts of f requenc y . The center f requency is t he offset of the CW freq uenc y . F or [...]

  • Página 208

    3-24 Making Tim e Domain Measurements T ransfor ming CW Time Measurements in to the Frequenc y Domain Figure 3 -19 Sepa ratin g th e A mplit ude an d P hase Comp onen ts of T est -Devic e-Ind uce d Mod ulati on F orw ar d T ransform Ra nge In the forw ard transfor m (from C W t im e to the fre q uency domain), range is defined as the frequency span[...]

  • Página 209

    3- 25 Making Time D o main Measurements T ransf or ming CW Time M easurements into the Frequen cy Domain Fi gu re 3-20 Range of a F orward T ransform Measurement T o increase the f requency domain m easurement range , increas e the span. The m aximum range is inversel y proportiona l to the sweep time, therefore i t may be necessary to incr ease th[...]

  • Página 210

    3-26 Making Tim e Domain Measurements Masking Masking Masking occurs when a discont inui ty (fault) c losest to the reference plane affects the resp ons e o f each subsequent dis continuity . This happens because the ener gy reflected f rom the f irst disconti nuity never reaches s ubsequent disc ontinuities . F or example, if a transmiss ion line [...]

  • Página 211

    3- 27 Making Time D o main Measurements Windowi ng Windowin g The analyzer provides a wind owing feature tha t makes time d om a in measurement s more useful for isolati ng and identif y ing individua l responses . Windowing i s needed bec a use of the abrupt t ransitions i n a frequenc y domain measur em ent at the sta rt and sto p frequencies . T[...]

  • Página 212

    3-28 Making Tim e Domain Measurements Window ing Choose one of the thr ee window shapes l isted or use the knob to s elect any windowing pulse width ( or ris e ti me for a step stim ulus) be tween t he soft key value s . The time domain stimul us sidelobe levels depend only on the w indo w selected. is essenti a ll y no window . Cons e q uentl y , [...]

  • Página 213

    3- 29 Making Time D o main Measurements Windowi ng Fi gu re 3-23 Th e Ef fects of Windowing on th e T ime Domain Responses of a S h ort Circ uit (Real F o r mat)[...]

  • Página 214

    3-30 Making Tim e Domain Measurements Range Range In the time domain, r ange is d efined as t he length in time that a me asurement can be made withou t encounteri ng a repetition of the res ponse, c a lled a liasing . A time d om ain resp ons e repeats a t regular i ntervals be cause the freq uenc y domain data is taken at discr ete frequency p oi[...]

  • Página 215

    3- 31 Making Time D o main Measurements Range In this ex ample, t he range i s 100 ns , or 30 meters el ectrical l ength. T o prevent the time domain resp onses from ove rlapping , the test device must b e 30 meters or less in e lectrical length for a transmiss i on measurement ( 15 meters for a reflect ion measurement). T he analyzer li mits the s[...]

  • Página 216

    3-32 Making Tim e Domain Measurements Resoluti on Resolu tion Two dif ferent resoluti on terms a re used in the ti me domain: • response res olution • range resoluti on Response Resolution Time domain response resolut ion is def ined as the a bility to resolve tw o closely -spaced resp ons es , or a measure of how close two responses can be to [...]

  • Página 217

    3- 33 Making Time D o main Measurements Resolution F or example, a cable wit h a teflo n dielectric (0.7 rel a tive veloc ity facto r ), measured und er the condit ions stated a b ove, ha s a fault l ocation measur em ent response r esoluti on of 0.45 centimeter s. T hi s is the ma ximum fault location r es ponse resol ution. F actors suc h as redu[...]

  • Página 218

    3-34 Making Tim e Domain Measurements Resoluti on Range Resolution Time domain r ange resol ution is def ined as the ability to locate a single response in ti me. I f only one r es pons e i s present, range resolution is a measur e of how c l os ely you can p i npo int the p ea k of t ha t response . The ra ng e resolutio n is equal to the dig i ta[...]

  • Página 219

    3- 35 Making Time D o main Measurements Gat ing Gating Gating pr ov ides the f lexibility of sele c tively re m oving time domain responses . The remaining ti m e domain resp onses can then be transformed b a ck to the f requency d om ain. F or reflec ti on (or f ault l oc ation) meas ur ements , use thi s feature t o remove the effects of unwanted[...]

  • Página 220

    3-36 Making Tim e Domain Measurements Gat ing Fi gure 3-27 Gate Shape Selecting Gate Shape The four gate shapes available a re listed in T a bl e 3 -4 . Ea ch gate ha s a differ ent passband fl a tness, c utof f rate, a nd sidelobe levels . The passb and ripple and si delobe level s are descr iptive of the gate shape . The cutof f time is the ti me[...]

  • Página 221

    4-1 4 P rint ing, Pl ottin g, a nd Sa vin g Mea surement Results[...]

  • Página 222

    4-2 Printing, Pl otting, and S aving Measurement Resul ts Using This C hapter Using This C hapter This cha pter contai ns instructi ons for the following t a sks: • Printing or plotting y our measurement res ults ❏ Confi g uring a p r int functi on ❏ Defini ng a print fun ction ❏ Printi ng one measurement per page ❏ Printi ng multiple mea[...]

  • Página 223

    4- 3 Printing, Pl otting, and S aving Measurement Resul ts Printi ng or Plo tting Y our M easurement Resul ts Printi ng or P lotti ng Y our Measur ement Result s Y ou c an print your m easurement resul ts to the following p er ipherals : • printers with GPIB interf a ces • pri n t er s wi th para ll el in t e rfa ces • printers with serial in[...]

  • Página 224

    4-4 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a Print Function Co nf igu ring a Prin t Function All c opy configur ation setti ngs are stor ed in non- volatile memory . Therefore , they a re not affected if yo u press or switc h off the a nalyzer power . 1. Connect the p rinter to the inter f ace por t. Figur e 4-1 Prin ter[...]

  • Página 225

    4- 5 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a Print Fu nct ion 3. Select one of the foll owing printer interfaces: • Choose if y our printe r has a GPIB i nterface , and then configure t he print func tion as f ollows: a. Enter the GPIB add ress of th e printer , follow ed by . b. Press a nd if there is no ex ternal co[...]

  • Página 226

    4-6 Printing, Pl otting, and S aving Measurement Resul ts Defi ning a Print F unct ion Defi ning a Print Fu nction NO TE The print d efinition is set to default values whenever th e power is cyc l ed. However , you can sa ve the pri nt definiti on by sav i ng the instr ument state. 1. P ress . 2. Press or . ❏ Choose if y ou are using a black and [...]

  • Página 227

    4- 7 Printing, Pl otting, and S aving Measurement Resul ts Defi ning a Print Fu nct ion T o Reset the P rinting P arameters to Defa ult V alues 1. Pre ss . T a b le 4 - 1 D e fau l t V a lu e s fo r P r i nt in g P a r am e te r s Printing Par am eter De fault Pr i nt er Mo de Mo noc h r o me Auto F eed O N Pr inter C olor s Chan nel 1 and 3 Data M[...]

  • Página 228

    4-8 Printing, Pl otting, and S aving Measurement Resul ts Printi ng One Measurement Per P age Printi ng One Meas u r ement P er P a ge 1. Configure and define t he print functi on, as ex plai ned in "Conf i guring a Print Functi on " on page 4- 4 an d "D efining a Print Function" on page 4- 6 . 2. P ress . If y ou defined the , [...]

  • Página 229

    4- 9 Printing, Pl otting, and S aving Measurement Resul ts Printi ng Multiple M easurements P er Page Printin g Mu lt iple Measurements P er P age 1. Configure and define the print f unct ion, as explaine d in "Configuri ng a Print Function " on page 4-4 and "Defining a Print Function " on page 4-6 . 2. Press and then p ress unt[...]

  • Página 230

    4-10 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function Configu rin g a Plot Fu nct ion All c opy configur ation setti ngs are stor ed in non- volatile memory . Therefore , they a re not affected if yo u press or switc h off the a nalyzer power . P eripheral Interface Re comme nde d Cab les Paralle l 92 28 4A GPI B[...]

  • Página 231

    4- 11 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a P lot Fu nct ion Informati on regarding a printer c ompatibil ity guide (an up-to-date l ist of pri nters that are c ompa tible wit h the network anal y zer) i s avail a ble i n "P rinti ng or Plotting Y our Measurement Res ults" on page 4-3 . 3. Configure the a na[...]

  • Página 232

    4-12 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function If Y ou Are Pl otting to a P en Plot ter 1. Press and then until ap pears. 2. Configure the analyzer for one of the f oll owing plotter i nterfaces: • Choose i f your p lotter has a GPIB interf ace, and then conf igure the p lot function a s follows: a. Ente[...]

  • Página 233

    4- 13 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a P lot Fu nct ion If Y ou Are Plotting Measurement Results to a Disk Drive The plot files tha t yo u gen erate from the a nalyze r , conta i n the H PGL represent ation of t he measurement di s play . The files w ill not c ontain any setup or formfeed comm ands . CAUTI ON Do [...]

  • Página 234

    4-14 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function Fi gu re 4-4 A ut om atic Fi le Naming Convention for LIF F ormat T o Output the P lot Files • Y ou ca n plot the f iles to a plotter from a personal c omputer . • Y ou can output your plot file s to a n HPGL compatible printer , by following the sequence [...]

  • Página 235

    4- 15 Printing, Pl otting, and S aving Measurement Resul ts Defin ing a P lot Function Defining a Plot Function 1. Pre ss . Choosing Disp lay Eleme nts • Choose which of the foll owing measurement disp lay element s that you want to ap p ear on your plot: ❏ Choose if you want the measurement data trace to appear on your plot. ❏ Choose i f you[...]

  • Página 236

    4-16 Printing, Pl otting, and S aving Measurement Resul ts Defi nin g a Plot Function NO TE The peripheral ignores w hen you are p lotting t o a qua dra nt. Selecting P en Numbers and Colors • Press and select the plot el em ent where you w ant to cha ng e the pen num b er . F or example, press and then modify the pen number . The pen number sele[...]

  • Página 237

    4- 17 Printing, Pl otting, and S aving Measurement Resul ts Defin ing a P lot Function Selecting Line Types • Pr ess and select ea ch plo t element line t ype that you w ant to modi fy . — Select to modify the line type for the dat a trace . Then enter t he new line ty pe (see Figure 4 -6 ), foll owed by . — Select to modify the line type f o[...]

  • Página 238

    4-18 Printing, Pl otting, and S aving Measurement Resul ts Defi nin g a Plot Function Fi gu re 4-7 Locations of P1 an d P2 in Mode Choosing Plot Speed • Press until the pl ot speed appea r s that you w a nt. ❏ Choose for normal plo tting. ❏ Choose for plott ing directly on transparenci es. (The slower speed p r ovides a m or e consis tent lin[...]

  • Página 239

    4- 19 Printing, Pl otting, and S aving Measurement Resul ts Plot ting One Measurement Per P age U sing a P en Plot ter Plot ting One Meas urement P er P a ge Using a P en Plot t er 1. Configure and d efine t he plot, as ex plained in " Conf ig uring a Plot Function" on pa g e 4-10 and "D efining a Pl ot Function" on page 4-15 . [...]

  • Página 240

    4-20 Printing, Pl otting, and S aving Measurement Resul ts Plot ti ng Multi pl e Measur em ent s P er Page Using a Pen Pl otter Plottin g Mu ltiple Measurements P er P age Using a P en Plo tter 1. Configure a nd define the plot, a s explained i n "Configuri ng a Plot Functi on" on page 4-10 and "Defining a P lot Function" on pag[...]

  • Página 241

    4- 21 Printing, Pl otting, and S aving Measurement Resul ts Plottin g Multiple M easurements P er P age Using a P en Plotter If Y ou Are Plotting to a n HPGL Compatible Printer 1. Configure and d efine t he plot, as ex plained in " Conf ig uring a Plot Function" on pa g e 4-10 and "D efining a Pl ot Function" on page 4-15 . 2. P[...]

  • Página 242

    4-22 Printing, Pl otting, and S aving Measurement Resul ts T o View Plot Files on a PC T o View P lot F i les on a PC Plot files can be v iewed and manipula ted on a PC usi ng a word proce s sor or g r aphics pres enta tion prog ram. Plot fi les contain a text s tr eam of HPGL (Hewlett- Pa ckard Graphics L anguage) c omma nds. In order to import a [...]

  • Página 243

    4- 23 Printing, Pl otting, and S aving Measurement Resul ts T o View Plot Fil es on a PC Using Ami Pro T o view plot files in Ami Pro, per form the f ollowing s teps: 1. From the FILE p ull-down menu, select IMPORT PICT U RE. 2. In the dialog box, change the File Type selecti on to HPGL. This automatically c hanges the f ile suffix in the fi lename[...]

  • Página 244

    4-24 Printing, Pl otting, and S aving Measurement Resul ts Outp utting Pl ot Fi les fr om a PC to a Plot ter Converting HPGL Files for Use with Other PC Applications A util ity can c onvert hpgl (or .fp) fil es to other P C applic ations. T his utili ty , named hp2xx , is a vailable to be d ownload ed without c ha rge (on d ona tion b asis only) f [...]

  • Página 245

    4- 25 Printing, Pl otting, and S aving Measurement Resul ts Out putt i ng P lot Files f rom a PC t o an HPGL Compatibl e Pri nter Output t in g Plot Files from a PC to an HPGL Compa tible Pri nter T o output the p lot files to an HPGL compat i ble printer , you can use the HPGL initial ization sequence linked in a s eries a s follows: Step 1 . Stor[...]

  • Página 246

    4-26 Printing, Pl otting, and S aving Measurement Resul ts Outp utting Si ngle Pa ge Plots Usi ng a Pri nter Step 2. Store the exit HPGL mod e and form feed s equence. 1. Create a t est file b y typing in ea ch charact er as shown i n the left c olumn of T a bl e 4 -8 . Do not insert spaces or linefeeds . 2. Name the file exithp gl . Step 3. Send t[...]

  • Página 247

    4- 27 Printing, Pl otting, and S aving Measurement Resul ts Outputt ing Mult iple P lots to a Singl e Pa ge Using a Printer Output t in g Multiple Plots t o a Single P age Usin g a Printe r Refer to "Plo tting Multipl e Measurements P er P age Using a P en Plotter " on page 4 - 20 for the naming conventions for plot fil es that you want p[...]

  • Página 248

    4-28 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multi pl e Measur ements P er Page fr om Disk Plottin g Mu ltiple Measurements P er P age from Disk The fol lowing procedur es show you how to store plot files on a LIF formatte d disk. A naming conv ention is us ed so you can later r un an HP B ASIC program on a n external contro[...]

  • Página 249

    4- 29 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multipl e Measurements Per P age f rom Disk T o Plot Multiple Measurements on a Full P age Y ou m ay want to plot v a rious fil es to the s a me page , for exampl e, to show measurement data traces for diff erent input s ettings, or para m eters , on the sa m e gratic ul e. 1. De[...]

  • Página 250

    4-30 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multi pl e Measur ements P er Page fr om Disk Figu re 4-1 0 shows pl ots for bot h the frequenc y and time domai n r esponses of the same dev ice . Fi gu re 4-10 Plotting Two F iles on the Same P age T o Plot Measur ements in P age Quadrants 1. Define the plot, as ex plained in &q[...]

  • Página 251

    4- 31 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multipl e Measurements Per P age f rom Disk 4. Press . The analyzer assigns the f irst available d efault f ilename for t he selec ted quadrant . F or example , the analyzer w ould assi g n PLOT01 LU if t here were no other lef t-upper quadrant p lots o n the disk. 5. Mak e the n[...]

  • Página 252

    4-32 Printing, Pl otting, and S aving Measurement Resul ts Tit li ng the Displa yed Measurement T itling the Dis played Measurement 1. Press to access t he title menu. 2. Press and enter the ti tl e you w ant for your measurement disp lay . • If you hav e a DIN keyboard attac hed to the analyzer , type the tit le you wa nt from the keyboard. Then[...]

  • Página 253

    4- 33 Printing, Pl otting, and S aving Measurement Resul ts Configur ing t he Anal yzer to Prod uce a Time St amp Config uring the Analyzer to Produ ce a Time S t amp Y ou c an set a cl ock, and then activate i t, if yo u want the time and date to appear on y our hardcopies . 1. Pre ss . 2. Press and enter the curr ent year , followed by . 3. Press[...]

  • Página 254

    4-34 Printing, Pl otting, and S aving Measurement Resul ts Pri nti ng or Plotting the List V alues or Operati ng P arameter s Printing or Plot ting the List V alues or Operati ng Pa r a m e t e r s Press a nd selec t the informatio n that you w ant to appear on y our hardcopy . • Choose if you want a tabular listing of the measured data p oints ,[...]

  • Página 255

    4- 35 Printing, Pl otting, and S aving Measurement Resul ts Solvi ng Pr oblems with P rinting or Plot ting Solving P roblems w ith Printin g or Plotting If y ou encounter a p r oblem when you a re printing or plotti ng, c heck the fol lowing li s t for po ssi ble cau ses : • Look in the analyzer displa y message area. The analy zer ma y show a me[...]

  • Página 256

    4-36 Printing, Pl otting, and S aving Measurement Resul ts Savin g and Recalling Instrument States Savi ng and R ecalli ng Instrument States Places Where Y ou Can Save • analyzer in ternal memory • floppy di s k using the analyzer's internal disk drive • floppy di s k using a n external di sk drive • IBM compatible p ersonal c omputer [...]

  • Página 257

    4- 37 Printing, Pl otting, and S aving Measurement Resul ts Savin g and Recalling Instrument States What Y ou Ca n Save to a Floppy Disk Y ou c an save a n instrument state and measurement results t o a disk. T he default fi le names are FIL En, w here n ge ts incr ement ed by one ea c h ti me a file with a def aul t na me is added to t he director[...]

  • Página 258

    4-38 Printing, Pl otting, and S aving Measurement Resul ts Savin g an Instrument State Saving an Instru ment State 1. Press a nd select one o f the storage d evices: ❏ ❏ ❏ connect an external disk drive to the analyzer ’ s GPIB connector , and co nf igure as f ollows: a. Connect an e x ternal d isk drive to the analyzer's G PIB connec [...]

  • Página 259

    4- 39 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving M easurement R esults Instrument states combined wi th measurements re s ults can only be saved t o disk. Fil es that conta in data-only , and the v arious sa v e optio ns avail a ble under the key , ar e also o n ly valid for disk saves. Th e an al yz [...]

  • Página 260

    4-40 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Fi gu re 4-13 Data P r oc essing Fl ow Diagram NO TE If the anal y zer has a n active two-p ort measurement cali bration, all four S-para m eters wil l be sav ed with the measurement resul ts. Al l four S-para m eters may b e viewed if the raw dat a array ha s [...]

  • Página 261

    4- 41 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s If you sele c t , , or , the data is stored to disk i n IEEE-64 bit real format ( for LIF disks ), and 32 bit PC format for DOS disks . This ma kes the DOS da ta files ha lf the si ze of the LI F file s. NO TE Selecting may also store d ata to di sk in the S2 [...]

  • Página 262

    4-42 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s If , or , or is s elected, a CIT Ifile i s save d for eac h displa yed channel wi th the suffi x lett er “D”, or “F”, follo wed by a number . The number f ollowing “D” a nd “F” f iles is t he channel number . When is selec ted, an “r1” file [...]

  • Página 263

    4- 43 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s The "format" choice is selected b y the curr ent selectio n under the FORMA T menu. T o select t he DB format, the F ORMAT must be L OG MAG. F or MA, the FORMAT m ust be LIN MAG (unlike CITIfi le), and all oth er FORMAT selec tions will out put RI da[...]

  • Página 264

    4-44 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving in T extu al (CSV) F orm T e xt u al mea sure m en t res ult s can b e save d in a co m ma-s e par ate d va lue (C S V ) fo rm a t a n d imported into a sprea dsheet applicat ion. Additi ona l inf or mation is a lso saved a s a preamble to the measuremen[...]

  • Página 265

    4- 45 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s How the A nalyz er Nam es T hese Files S equen tially When text fi les are sa ved, the ana lyzer generat es the file names automaticall y in the following format: txtcss. csv wh ere: tx t is a constan t that indi cates th at this is a te xt f ile , c is t h e [...]

  • Página 266

    4-46 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving in Grap hical (JP EG) F orm Graphical measurement results can be sav ed in JPEG format a nd used as a n illustr a tion in a text editor or desktop p ublishing a pp lication . 1 Up to ei ght traces m ay be s aved in the JPEG file . This is done by storing[...]

  • Página 267

    4- 47 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Instrument St ate Files When an instrume nt state is sa ved to a floppy disk, som e or all of the followi ng fil es may be p rod u ced . Th i s dep end s up on whi ch array s are se le ct e d u n de r the s oftkey menu, and whether the selected save for ma t i[...]

  • Página 268

    4-48 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Files with .d1 a nd .d2 Fil e Exte nsions There are tw o type of fi les with .d 1 and . d 2 file e xtensions . There i s Fil eXX .d1 ( or .d2) a nd Dat aX X .d 1 (o r . d2) . Fi leXX.d1, produced only when is turned ON , may be either binar y or ASCI I. This f [...]

  • Página 269

    4- 49 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Files w i t h .g0 File Extensio n FileXX.g0 , produced only when is t ur ned ON , is a b inary file containin g the acti ve measurement tra ce and di splay graticule. The cont ents of thi s fi le are not meant to b e read in an external computer , so this f il[...]

  • Página 270

    4-50 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Raw Arrays On the analyzer , press the Data cr eated the fir st time in this manner wi l l be sa ved as fil ena me “FILE00.r 1 ”. The f ile extensio n .r1 indi cates the d a ta was c reated while c hannel 1 w as active a nd stored in the ana lyz er's r[...]

  • Página 271

    4- 51 Printing, Pl otting, and S aving Measurement Resul ts Re-Sa ving an Instr umen t State Re-Savin g an I n strument State If y ou re-save a file , the analyzer overwrites t he existing fi le contents . NO TE Y ou cannot re- save a fi le that c ontains data on ly . Y ou m ust create a new file . 1. Press and select the s t orage devi ce . ❏ ?[...]

  • Página 272

    4-52 Printing, Pl otting, and S aving Measurement Resul ts Delet ing a File Deleting a F ile 1. P ress . 2. Choose fr om the foll ow ing storage devices: ❏ ❏ ❏ (If nec essary , refer to the ex ternal disk set up procedure in "Sa ving an Instrument St a te" on page 4- 38 .) 3. P ress . T o De lete an Instrument State File ❏ Press t[...]

  • Página 273

    4- 53 Printing, Pl otting, and S aving Measurement Resul ts Renami ng a File Renaming a File 1. Pre ss . 2. Choose from the f ollowing stor age devices : ❏ ❏ ❏ (I f necessary , refer to the ext er nal disk s etup procedure i n "Sav ing an Instrument State" on p age 4-38 .) 3. Press and th en use the or keys or the fr ont panel knob [...]

  • Página 274

    4-54 Printing, Pl otting, and S aving Measurement Resul ts Recalling a File Recalling a File 1. P ress . 2. Choose fr om the foll ow ing storage devices: ❏ ❏ ❏ (If nec essary , refer to the ex ternal disk set up procedure in "Sa ving an Instrument St a te" on page 4- 38 .) 3. Press the or key s or th e front panel knob to highli g h[...]

  • Página 275

    4- 55 Printing, Pl otting, and S aving Measurement Resul ts Solving Pr oblems with Saving or Recalling Files Solving P roblems wit h Savin g o r Recalling Files If y ou encounter a p r oblem when you a re storing f iles to d isk, or the a nalyzer int er nal mem ory , c heck the foll ow ing list f or possible ca us es: • Look in the analyzer displ[...]

  • Página 276

    4-56 Printing, Pl otting, and S aving Measurement Resul ts Solvi ng Prob lems with Savi ng or Recal ling Fil es[...]

  • Página 277

    5-1 5 Optimi zing Me asurem ent Results[...]

  • Página 278

    5-2 Optimizing Measur em ent Results Using This C hapter Using This C hapter This cha pter descri bes tec hni ques and analy zer functions tha t help y ou a chiev e the best measurement r esults . The fol lowing t op ics are i ncluded in thi s chapt er : • "Increasi ng Measurement Accurac y" on page 5 - 4 ❏ Inter conne cting cables ?[...]

  • Página 279

    5- 3 Optimizing Measurement R esults T aking C ar e of Microwa ve Connectors T aking Ca re of M icrow ave Connecto rs Proper co nnec tor car e a nd connecti on techniques are critic al for accur ate, r epeatable measurements . Refer to the calibrati on kit documentati on for connecto r care informati on. Pri or to making connections t o the network[...]

  • Página 280

    5-4 Optimizing Measur em ent Results Increasing Measurement Accuracy In creasing Measurement Accur acy The fol lowing all contribute t o loss of a ccuracy i n a measurement. Interconnecting Cables Cables tha t connect the device und er test (DUT) to the anal y zer are often the most signi f icant con tribution to r andom errors of y our measure m e[...]

  • Página 281

    5- 5 Optimizing Measurement R esults Increasing Measur em ent Accuracy T emperature Drift Electrica l character istics will change wi th temperature due to the thermal expansion characte ristics of d evices withi n the analyzer , cali bration device s, tes t devices , cab les, and adapters . Therefor e, the operating t em perature is a criti c al f[...]

  • Página 282

    5-6 Optimizing Measur em ent Results Increasing Measurement Accuracy Y ou can acti v a te a p or t extens ion by pressing . Then enter the delay to t he reference p lane. T able 5-2 Differences between PORT EXTE NS IONS and ELECTRICAL DE LA Y PORT EXTENSI ONS ELECTRICAL DELA Y Main Effe ct The end of a ca b le bec omes the test port plane for all S[...]

  • Página 283

    5- 7 Optimizing Measurement R esults Main t aining T est P o rt Out put P ower During Sweep Retrace M ain taining T e st P ort Output P o wer D uring S we e p Retra ce During sta nd ard operati on, the anal y zer provi d es output power d uring its forward frequency sw eep , but may not p r ovi de outp ut power during its s w eep re trac e . If the[...]

  • Página 284

    5-8 Optimizing Measur em ent Results Making Accu rate Measureme nt s of El ectrically Long Devices Maki ng Accura te Measuremen ts of Elect rically Long Devices A d evice wit h a long electr ical del ay , such as a lo ng length of c able, a SA W filter , or normal devic es measured over wid e sweeps with ver y fast r ates present s some unusual mea[...]

  • Página 285

    5- 9 Optimizing Measurement R esults Making Accurate Measurem ents of Elect ri call y Long De vices De creas i ng the Sweep Rat e The sweep r a te can be dec reased by inc reasing the a nalyzer’s s w eep time . T o increase t he analyzer’s s weep time , press and use t he front panel knob, the and keys, or the f ront panel keypad enter i n the [...]

  • Página 286

    5-10 Optimizing Measur em ent Results Increasing Sweep Speed Incre asing Sweep S peed Y ou can incre a se the anal yzer sweep speed b y avoi d ing the use o f some fea tures that requir e computational ti me for impl ementation and upda ti ng, s uch as bandwidth marker tracki ng. Y ou can also increase the sw e ep speed by m aking adjustm ents to t[...]

  • Página 287

    5- 11 Optimizing Measurement R esults Increasing S w eep Speed Sw eep S pee d-R elat ed Err or s IF delay occurs dur ing swept measurement s when the si gnal from t he analyzer sourc e is delay ed in reac hing the anal yzer receiver because of an electricall y long devi ce. T he receiver ha s a narrow IF band pass f ilter that t r ack s the rec ei [...]

  • Página 288

    5-12 Optimizing Measur em ent Results Increasing Sweep Speed T o Set the Auto Sweep T ime Mode Auto s w eep time mode i s the defa ul t mode (the preset mode). T his mode m aintains the fast es t sweep speed possible f or the c ur rent measurem ent settings . • Press , to re- enter the a uto mode. T o Widen the System Bandwidth 1. P ress . 2. Inc[...]

  • Página 289

    5- 13 Optimizing Measurement R esults Increasing S w eep Speed T o View a Sing le Measur ement Channel View ing a single channel wil l increase th e measurement speed if the analyze r’s cha nnels are in a lternate, or uncoupled m ode. 1. Pre ss . 2. Press and to a lternately view the two me a surement c ha nnels . If you must view bot h m easurem[...]

  • Página 290

    5-14 Optimizing Measur em ent Results Increasing Sweep Speed • Cont inuou s: In this mode the analyz er will switc h between the test ports on every sweep . Although thi s type o f test set switching provides the g reatest me a surement accu r acy , it re qu i re s a re v erse sw eep fo r e ve ry fo rwar d sw eep. NO TE Analyzers c onfigured w it[...]

  • Página 291

    5- 15 Optimizing Measurement R esults Increasing Dynamic Range Increa sing Dynamic Rang e Dynamic range i s the di f ference b etw een the ana lyzer’s maximum all owable in p ut level and minimum measurabl e power . F or a measurement to be valid, input signals m ust be within thes e boundaries . The dynamic range is affected b y these f actors: [...]

  • Página 292

    5-16 Optimizing Measur em ent Results Reducin g N oise Reduci ng Noise Y ou can use two a nalyzer f unctions to hel p reduce the effect of noise on the data trace: • activate m ea surement a v eraging • reduce sy s tem bandwidth • use di rect sam pl e r ac cess con fi gur at io n s (O ptio n 0 12 On ly ) T o Activate Av eraging The noi se is [...]

  • Página 293

    5- 17 Optimizing Measurement R esults Reducin g N oise T o Use Direct Sampler Access Configurations (Option 012 Only) Direct s ampler access to both the A and B samplers c an decre a se the noi s e floor of the analyzer . In the s tandard confi g uration ( Option 012 w i th all jumpers in pla ce), the signal enteri ng one of t he test ports p asses[...]

  • Página 294

    5-18 Optimizing Measur em ent Results Reducin g Receiver Crosst alk Reduci ng Rece iver Cro sstal k T o reduce r eceiver c r osstalk you c a n do the f ollowing: • P erform a resp onse and isolat ion measurement c a libration. • Set the s w eep to the alternate mode . Alter na te sweep i s intended f or measuring wide d ynamic r a nge devic es,[...]

  • Página 295

    6-1 6 Cali brat ing f or I ncr eased Measu remen t Accu racy[...]

  • Página 296

    6-2 Cali brat ing for Increased Measur ement Accuracy How to Use Th is Chapter How to Use This Cha pte r This cha pter i s divided int o the foll owing subjects: • "Calibrat ion Considerati ons" on page 6-4 • "Procedure s for Err or Correcti ng Y our Measurement s " on pa ge 6-10 — frequency r es ponse error correction —[...]

  • Página 297

    6- 3 Calibrating f or Increased M easurement Accuracy Intr oduction Introd uction The accuracy of network anal ysis is g r eatly inf luenced by fact ors external t o the network analyzer . Components of the measurement s etup, such as interconnecti ng cables and adapters , i ntr oduce v a riations i n magnit ud e and phase t ha t can mask t he actu[...]

  • Página 298

    6-4 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Ca libr ati on Co nsi de r atio ns Measurement P arameters Calibra tion procedur es are paramete r- specific, rather than c hannel-speci f ic. When a parameter i s select ed , the instrument chec ks the avai lable calib r ation data, a nd uses the data f ound for tha[...]

  • Página 299

    6- 5 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations • 90 to 100 dB: I solation c alibration i s recommended with test port power g reater t ha n 0 dBm. F or this isol ation cali b ration, averaging shoul d be turned on w ith an a veraging facto r at least f our times the measurement av er aging fac tor . F or exampl[...]

  • Página 300

    6-6 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Frequency Response of Calibration Standards In or d er for th e response of a refer ence standard to show as a dot o n the smith chart displ ay format, i t must hav e no phase shift w i th res p ect to fr equency . Sta nd ards that exhibi t such "per fect" [...]

  • Página 301

    6- 7 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations T able 6-1 Calibration Stan d ard Types and Expected Phase Shift T est Port Conn ector T ype Standa rd T ype Expected Phase Shift 7-mm Short 180 ° Type-N ma le 3.5-mm mal e Offset S hort 3.5-mm fe male 2.4-mm ma le 2.4-mm fe male Type-N f emale 75 Ω Type-N female [...]

  • Página 302

    6-8 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Fi gu re 6-1 Typical Re spon se s of Calibration S tandards after Calibration Interpolated Error Correction Y ou may wa nt to use inter pola ted er ror cor re cti on w hen y ou c hoos e a subset of a f re quency range th at you alrea dy corrected, when you change the[...]

  • Página 303

    6- 9 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations NO TE T he preset sta te of the i nstrument can b e configured so that int er polated error cor rection is on or off . Press to c onf ig ur e the pres et state of i nterpolated er ror correc tion. System per formance is unspecifie d when us ing inter polated err or c[...]

  • Página 304

    6-10 Cali brat ing for Increased Measur ement Accuracy Pr ocedur es f or E rr or Correcting Y our M easurements Proc edur es for Error Correct ing Y our Measur ements This sec tion has exampl e procedures or information on t he following top i cs: • frequency r esponse correc tion • frequency r esponse and isol ation corr ec tion • enhanced f[...]

  • Página 305

    6- 11 Calibrating f or Increased M easurement Accuracy Pro cedures fo r Err or Correctin g Y our Measurements NO TE Resp onse calib ration is not as accurate as other cali bration methods . En han ce d R e spo nse and En hanced Reflection Transmis s i on or reflect ion measurement w hen improved accurac y is desired. Not a s acc urate as 2-port cal[...]

  • Página 306

    6-12 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Fr e q uency R espon se Error Correc t ions Y ou can remove the frequency re s ponse of the test setup for the fol lowing measurements: • reflec ti on measurements • transmission m ea surements • combined ref lection and transmission measuremen ts R[...]

  • Página 307

    6- 13 Calibrating f or Increased M easurement Accuracy Frequency Response Erro r C orr ections Fi gure 6-2 S ta n dard Connect ions for a Response Error Correct ion for Reflecti on Measurement 7. T o measure t he standard when t he display ed trace has s ettled, pres s or . If the calibrat ion kit you sel ected has a choice b etween male and f em a[...]

  • Página 308

    6-14 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Response Error Correction for Transmission Measurements 1. P ress . 2. Select the type of m ea surement you want to make . ❏ If you want to m ake a transmissi on measurement in th e forward directio n (S 21 ), press : or on ET model s: ❏ F or ES a nal[...]

  • Página 309

    6- 15 Calibrating f or Increased M easurement Accuracy Frequency Response Erro r C orr ections NO TE Do n ot use an open or short stand a rd for a transmission r esponse correc tion. NO TE Y ou can sa v e or st or e the measur em ent correc tion to use for later measurements . Refer t o the Chapter 4 , “Printing , Plotting , and Sav ing Measureme[...]

  • Página 310

    6-16 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Figure 6-4 St anda rd Conne ctions f or a Rec eiver C alibratio n 3. T o choose a non-ratioe d measurement, pr ess : F or ES analyzers , press . This s ets the sour ce at PORT 1. 4. Set any other measurement par am eters that you want f or the devic e mea[...]

  • Página 311

    6- 17 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections Frequen cy Response an d Isolat ion Er ror Corr ections Y ou c an make a response and isolati on correcti on for the fol lowing measurement s : • reflection m ea surements • transmission meas ur ements • combined r efl ection and tra n[...]

  • Página 312

    6-18 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response and Isolation E rror C orrections 7. Make a "thru" connection b etween the point s where you wil l connect your device und er test. NO TE Include any adapters that y ou will ha ve in the d evice measurement. That is , connect t he sta ndard devic e to the p articul[...]

  • Página 313

    6- 19 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections 12.Return the a v eraging to the ori gina l state of the measurement. F or example , reduc e t he av er aging fac tor by at l ea st four times or turn a veraging of f . 13.T o compute the i solation er ror coeffi cients , press: The anal y z[...]

  • Página 314

    6-20 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response and Isolation E rror C orrections 5. If your calibra tion kit is dif ferent tha n the kit s peci f ied under the sof t key , pre ss: (selec t your type o f kit) If y our type of c alibratio n kit is no t listed in the display ed menu, refer to "Modifyi ng Calibration K [...]

  • Página 315

    6- 21 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections The anal y zer displ ays WAIT - MEA SU RIN G C AL ST AND ARD during the sta ndard measurement. T he anal y zer underli nes the softkey tha t you sel ec ted after it fi ni shes the meas ur ement, and c om putes the er ror coeffi cients . 9. C[...]

  • Página 316

    6-22 Cali brat ing for Increased Measur ement Accuracy Enhanced Frequency Response Err or Correcti on Enha nced F requen cy Respons e Error Co rrecti on The enhanc ed frequenc y response error c orrection removes the f ollowing errors in the forwar d d irecti on in ET mode ls or in b oth the forw ard and reverse directi ons in ES models: • remove[...]

  • Página 317

    6- 23 Calibrating f or Increased M easurement Accuracy Enhanced Frequency Response Erro r Correcti on 6. T o selec t the correc tion type, pr ess and s el ect the c orrection ty pe. ❏ If y ou want to m ake measurements i n the for ward d irec tion, press: or on ET models: ❏ F or ES analyzers , if y ou want to m ake measurements i n the reverse [...]

  • Página 318

    6-24 Cali brat ing for Increased Measur ement Accuracy Enhanced Frequency Response Err or Correcti on 12.T o measure the sta ndard, when the d isplaye d trace ha s settl ed , press: , se lect the ty p e of lo ad y ou are us ing , and then pr ess when the analyze r has finished m easuring the load. Notice t hat the so f tkey is now underline d . 13.[...]

  • Página 319

    6- 25 Calibrating f or Increased M easurement Accuracy Enhanced Frequency Response Erro r Correcti on b. Activate at l east four times more av er ages than d esired duri ng the devic e measurement. c. Pr ess . d. Return t he averaging to the orig inal state of the measurement , and press . 18.T o compute the e rror coef ficients , press . The anal [...]

  • Página 320

    6-26 Cali brat ing for Increased Measur ement Accuracy One-P ort Reflection Error C orrection On e -P o rt Re fl ection Error Co rrec t ion • removes dir ec tivity errors of t he test se tup • removes sourc e match error s of the test setup • removes freq uenc y respo ns e of the test setup Y o u ca n p e rfo rm a 1- po rt co rr ectio n fo r [...]

  • Página 321

    6- 27 Calibrating f or Increased M easurement Accuracy One-Po rt Reflection Erro r C orrection NO TE Include any a d apters that you will ha ve in the dev ice measurement . That is , connect the c alibration standard to the p articular connector where y ou will connect your d evice under test. Fi gure 6-8 S ta n dard Connect ions for a One P ort Re[...]

  • Página 322

    6-28 Cali brat ing for Increased Measur ement Accuracy One-P ort Reflection Error C orrection The analyzer d isplay s the corre cted data tr a ce. T he analyzer al s o shows the notation Cor to the left of t he screen, i ndicating that the cor rection is s w itched on for this channel. NO TE The open, short, and load coul d be measured in a ny orde[...]

  • Página 323

    6- 29 Calibrating f or Increased M easurement Accuracy Full T w o- P or t Erro r Correction (ES Anal yzers Onl y) Ful l Two- P ort Erro r C orrect ion (E S A nalyze r s On ly) • removes directi vity error s of the test setup in f orward a nd reverse directions • removes source m atch err or s of the test setup in for ward an d re v erse dir ect[...]

  • Página 324

    6-30 Cali brat ing for Increased Measur ement Accuracy Full T wo-P ort Error Correcti on (ES Analyzers Only) Figur e 6-9 St anda rd Conne ctio ns for Full Tw o -P ort E rror C o rrection 6. T o measure the s tandard, when the display ed trace ha s settled , press: The analyzer d isplay s WAIT - M EAS URI NG CA L S TAN DA RD during th e standard mea[...]

  • Página 325

    6- 31 Calibrating f or Increased M easurement Accuracy Full T w o- P or t Erro r Correction (ES Anal yzers Onl y) 14.Make a "thru" connectio n between the poi nts where you wil l connect y our device und er test a s shown i n Fi gu re 6- 9 . NO TE Include any a dapter s or cables tha t y ou wi l l ha v e i n the d evice m easur ement . Th[...]

  • Página 326

    6-32 Cali brat ing for Increased Measur ement Accuracy Full T wo-P ort Error Correcti on (ES Analyzers Only) 17.T o compute the er r or coeff icients , press : The analyzer d isplay s the corre cted measurement tr a ce. The analyzer a lso shows t he notation Cor at the left of the screen, i ndicating that error c orrectio n is on. NO TE Y ou can s [...]

  • Página 327

    6- 33 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on P ow er M eter M e asu reme nt Calib ratio n A GPIB-compatib le power mete r can monitor a nd correct RF source power to a chieve leveled pow er at the te st port. During a power meter ca li bra tion, the p ower met er sa mples the power a t each meas ureme[...]

  • Página 328

    6-34 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration Interpolation in P ower Meter Calibration If the frequency is changed in li nea r sweep, or the sta rt/stop pow er is cha nged in power sweep , then t he calibration d ata is inter polated for the new range . If c alibrati on power is c ha nged in any of [...]

  • Página 329

    6- 35 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on ❏ If y ou are modifying the frequency , enter the new value, followed by a , , or key . ❏ If y ou are modifying the correction f actor , enter the new value , follo w ed by the key . 4. Press after you hav e finished mo d ifying t he segment. 5. If you [...]

  • Página 330

    6-36 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration NO TE Remember to subtrac t the through a rm loss f r om the coupl er arm loss b efore enteri ng it i nto the power l oss table, to ens ure the correct power at the output of t he coupler . 4. Repeat the p revious two s teps to enter up to 12 frequency se[...]

  • Página 331

    6- 37 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on 3. Select t he a nalyzer a s the sy s tem control ler: 4. Set the p ow er meter’ s address (“XX” represents the address in the following keystrokes: 5. Select t he a ppropriate power meter by p r essing until the c orrect model number i s display ed ([...]

  • Página 332

    6-38 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration Using Continuous Correction Mode Y ou can set the analyzer to up date the cor rection table at each sweep (as in a l eveling applica tion), using the continuous s ample mode . W hen the analyzer is i n this mode, i t conti nuously checks power at e v ery [...]

  • Página 333

    6- 39 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on T o Calibrate the Analyzer Receiver to Measu re A bsol u te P ower Y ou can use the power meter calibrati on as a referenc e to calibrate the analy zer receiver to accuratel y measure absol ute power . The followi ng procedure show s you how to c a librate [...]

  • Página 334

    6-40 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices Ca libr ating for No ni ns ert able D evic es A tes t device that c annot be c onnected directly into a tr ansmission test c onfiguration i s consider ed to be noninser t able . Some ex amp les of nonins ertable test devices are: • a fixt ur e with tw[...]

  • Página 335

    6- 41 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices Adapter Rem oval Cal ibration (ES Analyz ers Only) Adapter r em oval calibr ation provid es the most c omplete and acc ur ate proc ed ure for measuring noninsertable dev ices. The foll ow ing adapters are needed: • Ada pter A1, w hi ch mates w ith p[...]

  • Página 336

    6-42 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices P erform the 2-P ort Error Corrections 1. Check the firmware to see if y our revision s upports adapter r em oval ca libration by pre ssing: 2. Determine the delay of a dapter A3. a. Refer to Figu re 6-14 while perf or ming the s teps in t his procedure[...]

  • Página 337

    6- 43 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices NO TE Y ou must use t he floppy d isk to store t he following c a librations . Select the floppy dis k by pressi ng . 3. Connect adapter A3 (same sex and c onnector ty p e as the DUT) to adapter A2 on port 2 as s how n in Figu re 6-15 . Fi gure 6-15 T[...]

  • Página 338

    6-44 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices 6. P erform a ful l 2-port c a libration b etween ports 1 and 2 using c alibration s tandards appropriate for the c onnector type a t port 2 (the co nnec tor type f or adapter A2 ) . Save the calibration by selecting . Name the file "PORT2." N[...]

  • Página 339

    6- 45 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices V erify the Results Since the effect of the adapter has been removed, i t is easy to v erify the accuracy of the techni q ue by simply measuring the ada p ter itsel f. Because t he adapter wa s used duri ng the creat ion of the tw o cal sets , an d th[...]

  • Página 340

    6-46 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices Modify the Cal Kit Thru Definition Wi th this method, it is onl y necessary to use a th r u adapter . The calibr ation kit thru defini tion is modified t o compensa te for the adapter and then sav ed as a user kit. However , the e l ectrical delay of t [...]

  • Página 341

    6- 47 Calibrating f or Increased M easurement Accuracy Minimi z ing Er r or W hen Using Adapte r s 9. Pe rform the des ired calibr a tion with this new user ki t. 10.Connect t he test devic e as shown in Figur e 6 -17 and measure the device . Mini mizi ng E rror W he n Usi ng A dapt ers T o minimi ze the error introduce d when you a dd an adapter t[...]

  • Página 342

    6-48 Cali brat ing for Increased Measur ement Accuracy Making No n- Coaxial Measur em ents Making Non- C oaxial Me asu rements Non-coax i al, on- wafer measurement s present a unique set of challeng es for er r or correcti on in the analyzer: • The close s pacing between th e m icrowav e probes m a kes it di fficult to m aintain a high degree of [...]

  • Página 343

    6- 49 Calibrating f or Increased M easurement Accuracy Making Non - Coaxial Measure m ents If Y ou W ant to Design Y our Own Fixture Ideall y , a fixture shoul d provide a transparent c onnection between the tes t instru ment and the test device. This means i t should have no loss or electrical length and a f lat f r equency response , to pr event [...]

  • Página 344

    6-50 Cali brat ing for Increased Measur ement Accuracy Calibrati ng f or Non-Coaxial D evices (ES Analyzers O nly) Calibr ating for No n-Coaxi al Devic es (ES A na lyzers Only) The anal y zer has the capabilit y of making cali b rations u s ing the TRL*/LRM* met hod. TRL* and L R M* are i mplementations of the thru-r eflect-l ine and line-r eflect-[...]

  • Página 345

    6- 51 Calibrating f or Increased M easurement Accuracy Calibrating f or Non-Coaxial De vices (ES Analyzers Onl y) 6. F or the purposes of th is example , change the na me of the sta ndard by pressi ng: and modi f ying the name to "LINE." 7. W hen the t i tle ar ea shows the n ew label, p ress: Assign the Standards to the V arious TRL Clas[...]

  • Página 346

    6-52 Cali brat ing for Increased Measur ement Accuracy Calibrati ng f or Non-Coaxial D evices (ES Analyzers O nly) P erform the TRL Calibration 1. P ress . 2. T o measure the "TRL THRU ," connec t the "zero l ength" tran s mission line b etween the two test p orts . 3. T o make the nec ess ary four me asurements, press . 4. T o [...]

  • Página 347

    6- 53 Calibrating f or Increased M easurement Accuracy Calibrating f or Non-Coaxial De vices (ES Analyzers Onl y) NO TE Y ou can sa v e or st or e the measur em ent correc tion to use for later measurements . Refer t o Chapter 4 , “Printin g, Plotting, a nd Savi ng Measurement Results” f or procedures . 13.Connect t he device under test. The d [...]

  • Página 348

    6-54 Cali brat ing for Increased Measur ement Accuracy LRM Erro r Co rr e cti on LRM Erro r C orre ction Create a User -Defined L RM Calibration K it In or d er to use the L RM technique , the c a libration s tandards c ha racteri s tics must b e entered i nto the anal yzer’s user d efined c a libration ki t. The following steps show you how to d[...]

  • Página 349

    6- 55 Calibrating f or Increased M easurement Accuracy LR M E rror Co rrect ion Assign the Standards to the V arious LRM C lasse s 8. T o assig n the calibrati on standards t o the various T RL calibr a tion cl asses, press: 9. Since you p r eviously d esignated sta nd ard #1 f or the REFLECT standard, press: 10.Sinc e y ou previousl y designated s[...]

  • Página 350

    6-56 Cali brat ing for Increased Measur ement Accuracy LRM Erro r Co rr e cti on P erform the LRM Calibration 1. Y ou must ha ve a LRM cali bration kit d efined and sa ved in the USER KIT , as shown i n "Modifying Calibration Kits" on pa ge 7-57 . NO TE This must be d one before pe r forming t he following s eq uence. 2. P ress . 3. T o m[...]

  • Página 351

    6- 57 Calibrating f or Increased M easurement Accuracy LR M E rror Co rrect ion NO TE Y ou should per form the is ol ation measur em ent when the hi ghest dynamic rang e is desire d. T o perform the b est isolati on measurements , you s hould reduce the system bandwidth or a ctivate t he averagi ng function. A poorly m easured isolati on class can [...]

  • Página 352

    6-58 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) Calibr ating Usin g Electron ic Calibr ation (EC al) This sec tion descri bes Electronic Calibrati on (ECal). Use the f ollowing steps to per form the cali b ration. 1. Set up t he m easurement f or which you are cali brating . Refer to “[...]

  • Página 353

    6- 59 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Connect the ECal Equipment 1. Connect the powe r supply to the PC interfa ce unit. Ref er to Fi gur e 6 -21 . Fi gure 6-21 ECal Setup 2. Connect the powe r supply to the ac s our ce. 3. Connect one end of a DB25 cable to the P arallel P or[...]

  • Página 354

    6-60 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 5. If y ou need to cal ibrate with a second ECal module , connect one end of another DB25 cable t o the connecto r on the P C interface uni t label ed "DB25 Interf ace to ECal Module B". Connec t the other e nd of the DB25 cable t[...]

  • Página 355

    6- 61 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) • ECal using isol ation aver aging During the isolati on m easurement p ortion of ECa l, you are a ctually measuring instr ument crosstalk. T ypically, the data during t his measurement i s near the noise floo r . (See als o "Omitt [...]

  • Página 356

    6-62 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) P erform the Calibration 1. P ress . When ECal i s fi rst sele cte d (or when you select module A or module B), the re is a small initial delay so t hat the net work analyzer c a n detect and d ownload the ca libration informati on from the[...]

  • Página 357

    6- 63 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Figure 6 -22 M anual T hru S etup 5. After you c onnect the manual thr u, press to complet e the manual thru por tion of the ECal. 6. If you are c alibrating using two ECal mo d ules , a prompt is displayed directing y ou to remove the f i[...]

  • Página 358

    6-64 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 7. After you connect the sec ond ECal module , press to continue the ECal. 8. Repeat st ep s 4 and 5 if you sel ec ted to ca librate usi ng the manual thru op tion. 9. Review the d i spla yed calibration r esults . Refer to "P erform t[...]

  • Página 359

    6- 65 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) P erform the Confiden ce Check The confi d ence check i s a means of vi sually checking the quality of the ca l ibration. T he confidence c heck dis p lays the cur rently measured d ata (DA TA trac e) and the factory- premeasured data (MEM[...]

  • Página 360

    6-66 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 5. Press unt il the cal ibration conf idence check tr ace that you w a nt to view is di spla yed . Pressing the softkey toggles between the five tr a ce-type displa y options. T he confid enc e check ca n display the me a sured ECal r esult[...]

  • Página 361

    6- 67 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Investigating th e Calibra tion Results Using the ECal Service M enu CAUTI ON The confidence c heck described in t he p revi ous section disp lays the ECal data of a sing le state. This c onfidence sta te is a cal ibrated standard not used[...]

  • Página 362

    6-68 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) NO TE W hen returning to the Conf idence Check m enu from the ECal Se r vice menu, pres s the softkey on the ECal Confidence Check menu. I f this s oftkey i s not pres s ed, the conf idence ch eck informati on displ ayed may not be accurate[...]

  • Página 363

    6- 69 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) Ada pter Remov al Using EC al ( ES Analyz ers Only) A device under test (DUT) w hose connector s cannot be co nnected direct ly to a t es t configura tion is consi d ered to b e a noninsertable de vice . See Figure 6-2 5 Noninsertable devices ca [...]

  • Página 364

    6-70 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Figur e 6-2 6 Adap ters N eed ed The fol lowing requir ements must also b e met: • An ECal module f or performing a 2-por t error corr ec tion for e ach connector type must be avai la ble. • Specified e lectrica l length of a d apter A3 w ithi[...]

  • Página 365

    6- 71 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) P erform the 2-P ort Error Corrections 1. Connect ada pter A3 to a da pter A2 on port 2 as shown in Figur e 6-27 . Fi gure 6-27 Two-P ort Cal Set 1 2. Connect the ECal module between ad a pter A1 and ada pter A3. 3. Pre ss . 4. Press to perform t[...]

  • Página 366

    6-72 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Fi gu re 6-28 Two-P ort Cal Set 2 7. Connect the ECal module betwee n a dapter A3 and adapter A2. 8. P ress . 9. Press to p erform t he second 2-port error corr ec tion using the ECal mod ule. 10.Save the results to disk. N ame the file "PORT[...]

  • Página 367

    6- 73 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) Determine the Electric al Delay This proced ure determines the el ectrical delay of a dapter A3 usi ng a short. 1. Refer to Figu re 6-29 while perf or ming the s teps in t his procedure . 2. P erfor m a 1-port ca libration a t “Refer enc e P or[...]

  • Página 368

    6-74 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Remove the Adapter When the t wo sets of er ror cor r ection f iles have b een creat ed (now referred to as "cali bration sets "), the A3 ada pter ma y be removed. 1. Press to d isplay t he following menu: 2. P ress to display and . al s[...]

  • Página 369

    6- 75 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) 10.Connect t he DUT to the netw ork analyzer as s hown in Figure 6- 30 to perfor m cali brat ed measurements . Figure 6 -30 Calib rated Measu rem ent V erify the Results Since the effect of the adapter has been removed, i t is easy to v erify the[...]

  • Página 370

    6-76 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only)[...]

  • Página 371

    7- 1 7 Oper ati ng Co ncepts[...]

  • Página 372

    7- 2 Operating Concept s Using This C hapter Using This C hapter This cha pter provides conceptual i nformation o n how speci f ic funct ions of the netw ork analyzer o p erate . The fol lowing topi c s are disc ussed: • “S ys tem Op erat i on ” o n pag e 7-3 • “Process i ng” on page 7 -5 • “Output P ow er” on p a ge 7-9 • “Sw[...]

  • Página 373

    7- 3 Operati ng Concepts System Operation System Operati on Network analyzer s measure the r eflec ti on and t r ansmission cha racteristi c s of devices and networks . A network ana lyzer test syste m consists of t he follow i ng: • sou rce • signal-separat ion devices • receiv er •d i s p l a y The analyzer ap plie s a sig nal tha t is tr[...]

  • Página 374

    7- 4 Operating Concept s System Operation The RF outp ut power i s leveled by an int ernal ALC (autom a tic l ev eling contr ol) c ircuit. T o achie ve frequency acc uracy and phase mea suring capa b ility , the analy zer is phase locked to a highly sta b le crystal os cillator . F or thi s purpose, a portion of the tr a nsmitted signa l is routed [...]

  • Página 375

    7- 5 Operati ng Concepts Processing Proc e ssing The analyzer ’s receiver converts the R, A, and B input signals i nto useful me asurement informati on. This conv er sion occ ur s in two m a in steps: • The swept high frequency i nput signals are tra nslated to fixe d l ow frequency IF signals , using analog sampling or mixing tec hni ques . ( [...]

  • Página 376

    7- 6 Operating Concept s Pr ocessi n g While onl y a s ingle flow p ath is s hown, two identical p aths are a vailable , corr esponding to channel 1 and c hannel 2. Eac h channel al so has an auxilia r y channel f or which the d ata is proce s sed along w i th the pr imary channel’ s data. Cha nnel 3 is the auxiliary channel for channel 1, whil e[...]

  • Página 377

    7- 7 Operati ng Concepts Processing Pre-Raw Data Arrays Th e se dat a a rray s store the re su l ts of all the pr ec eding data processing oper ations . (Up to this point, a ll process ing is perf ormed real-ti m e with the swe ep by the IF process or . The remaining operati ons are not necessar il y synchr oni zed with the sweep , and ar e perform[...]

  • Página 378

    7- 8 Operating Concept s Pr ocessi n g Tran sform (Option 010 Only) This t ransform converts frequency do m a in inf or mation into the time do m a in when i t is activ a ted. The r esults r esemble time domain reflectometry (TDR) or impul se-response measurements . The transform uses the chirp- Z inverse f a st F ourier tr a nsform (FFT) algor ith[...]

  • Página 379

    7- 9 Operati ng Concepts Out put Power Output P owe r Understanding the P ow er Ranges The built - in synthes ized source c ontains a progr am mable step at tenuator that a llows you to directl y and accur a tely set p ow er lev el s in twel ve different power ranges . Each range has a to ta l span o f 20 dB ( 1 5 dB, 8722ET/ES). The twelv e ranges[...]

  • Página 380

    7- 10 Operating Concept s Out put Power NO TE After measureme nt c a libra tion, you can c ha nge the pow er w ithi n a r a nge and still maintain near ly full a c curacy . In some cases b etter accuracy can be achiev ed by changi ng the power wit hin a range . It ca n b e usefu l to set differ ent power lev els for ca libration and m ea surement t[...]

  • Página 381

    7- 11 Operati ng Concepts Sweep Time Swe ep Ti me The softkey se l ects sweep time as the act ive entry and s hows whether the automati c or manual mode is active . The fol lowing explains the diffe r ence between automatic a nd manual sweep t ime: • Ma nual swee p time. As long as the sel ec ted sweep s peed is wit hin the capa b ility of the in[...]

  • Página 382

    7- 12 Operating Concept s Sweep Time In additio n to the these parameters , the actual cycle time of the analyzer is also dependent on the f ollowing meas urement parameters: • smoothing • l im it t es t • tra ce ma th • m ar ke r stat i stics • time domain (Option 010 only ) Refer to the specificati ons and char acteristic s chapters of [...]

  • Página 383

    7- 13 Operati ng Concepts Sour ce Atten uator Sw i tc h Pr ot ection Sourc e At tenuator Switch Pr otection The programmable step attenuator o f the source can be s witched bet ween port 1 and port 2 when the test port power i s uncoupled, or between cha nnel 1 and cha nnel 2 when the channel pow er is uncouple d. T o avoid pr emature wear of the a[...]

  • Página 384

    7- 14 Operating Concept s Channel Stim ulus Cou pling Cha nnel Sti mulus Coupl ing toggles the channe l coupling of stimulus v alues. With ( the preset c ondition), both c hannels have the sa m e stimulus val ues. (The ina ctive cha nnel takes on the stimulus v a lues of the active channel.) In the stimulus coup led mode, the followi ng parameters [...]

  • Página 385

    7- 15 Operati ng Concepts Sweep T ypes Swe ep Types The foll ow ing sweep types will f unc tion wit h the interpol ated error -cor rection fea tur e (describ ed in “ Interpolated Er ror Correcti on” on page 6-8 ): • linear fre q uency • pow e r sweep •C W t i m e The foll ow ing sweep types will not f unction with the interpo lated error [...]

  • Página 386

    7- 16 Operating Concept s Sweep T ypes NO TE Earlier 8719, 8 720, and 8722 mo d els all ow ed a maximum of 1 632 points , but this v alue was reduced to 1601 to a dd the 4 channels in the 4 -parameter dis play feat u re. One l ist is common to both channels . Once a f requency list ha s been d efined and a measurement calib rati on performed on the[...]

  • Página 387

    7- 17 Operati ng Concepts Sweep T ypes The frequenc y subsweeps , or seg m ents, can be define d in any of the follo w ing terms: • start/stop/number of points • start /stop/step • center/span/ number of points • center/s pan/step • CW frequency The subsweeps c a n overl a p, a nd do not ha ve to be entered in any pa r ticular or d er . T[...]

  • Página 388

    7- 18 Operating Concept s Sweep T ypes The fr equency subsweeps , or segm ents , can be d efined i n a ny of t he following terms: • start/sto p/number of points /power/IFBW • start/sto p/step/power/IF BW • center/s p an/number of poi nts/power/I F BW • center/s p an/s tep/power/IFBW See “Setting Segment Pow er ” and “Setting Segment [...]

  • Página 389

    7- 19 Operati ng Concepts Sweep T ypes Sett ing Segm ent IF Band widt h T o enable th e func tion, you must f irst selec t in the edit s ubsweep menu. List IF b a ndwidth is of f by d efault and the aster i sks that ap p ear in the "I FBW " column of the list table indic a te that the IF bandwidt h for the sweep is being se t by the norma[...]

  • Página 390

    7- 20 Operating Concept s S-P ara meter s S-P a ra me t ers The key acc ess es the S- parameter menu whic h contains s oftkeys tha t can be used to s elect the para meters or inp uts that define the type of m easurement b eing perfor med. Understanding S-P ara meters S-para m eters (scatter ing paramete r s) are a convention used to characterize th[...]

  • Página 391

    7- 21 Operati ng Concepts S-Para me ters Fi gu re 7-3 S-P arameters of a Two-P ort D evic e S-parameter s are exactl y equivalent to these more common desc ription ter m s , requiri ng only that t he measurements be ta ken with all test devic e ports properl y terminated. S- Par ame ter Defin itio n T e st S e t D escr ipt ion D irec t ion S 11 b 1[...]

  • Página 392

    7- 22 Operating Concept s S-P ara meter s The S-P arameter Menu The S-p a rameter menu al lows you to d efine the input ports a nd test set direction f or S-para m eter measurement s. Th e a nalyzer a utom atically s witches the direction of the measurement a ccording t o the selec tions you made i n this menu. T herefore, the analyzer can meas ur [...]

  • Página 393

    7- 23 Operati ng Concepts S-Para me ters Fi gu re 7-4 Reflection Impedance and Admittance Conversions In a tra ns mission meas ur ement, the d ata can be c onv erted t o its equiv a lent serie s impedance or a dmittance us ing the model a nd equatio ns shown in Figure 7-5 . Fi gu re 7-5 Transmission Impedance and Admittance Conversions NO TE Avoid [...]

  • Página 394

    7- 24 Operating Concept s Anal yz er Displa y Formats Analyzer Dis play F o rmats The key a c cesses the f ormat menu. This m enu allows you to select the appropri ate displa y format for the measured dat a . The anal y zer automati c ally c ha nges the units of measu r ement to co r respond with the displ ayed format. Sp ecial marker m enus are a [...]

  • Página 395

    7- 25 Operati ng Concepts Analyzer D i splay Formats Fi gu re 7-7 Phase F ormat Group Delay F ormat The sof tkey selec ts the g roup delay format, with marker v alues giv en in seconds. The bandpass filte r r esponse f ormatted as group del ay is shown in Fig ure 7-8 . Group delay principles a re descri b ed in the next few pages . Fi gu re 7-8 Gro[...]

  • Página 396

    7- 26 Operating Concept s Anal yz er Displa y Formats Smith Chart F ormat The softke y displa y s a Smith ch art format. Ref er to Figur e 7-9 . Thi s is used i n reflecti on m easurements t o provide a rea dout of the data in terms o f impedance . The i ntersecting d otted lines o n the Smith c hart represent c onstant resista nce and consta nt re[...]

  • Página 397

    7- 27 Operati ng Concepts Analyzer D i splay Formats P olar F orma t Th e soft k e y disp lay s a pola r form at as show n in Fig ure 7- 10 . Eac h point on the polar fo rm at corres p onds to a p articular v alue of both m agnitude and phase . Quantit ies are read vectorally : t he magnitude at any point i s determined by its displacement from the[...]

  • Página 398

    7- 28 Operating Concept s Anal yz er Displa y Formats Figure 7-11 Li nea r Mag nitude Format SWR F ormat The sof tkey reformats a reflec tion measurement i nto its equi valent SWR (stan d ing wav e ratio) v alue. S ee Fig u re 7- 12 . SWR is equivalent to (1 + ρ )/(1 − ρ ), whe r e ρ is the reflec tion coeff icient. Note that the resul ts are [...]

  • Página 399

    7- 29 Operati ng Concepts Analyzer D i splay Formats Real F ormat The soft k ey displa ys only the r eal (resisti ve) porti on of the meas ur ed data on a Cartesi a n format. See Fig ure 7 -1 3 . This is simi lar to the linea r magnitude format, bu t can show both positive and negati ve values . It i s primarily used for anal yzi ng responses in th[...]

  • Página 400

    7- 30 Operating Concept s Anal yz er Displa y Formats Fi gure 7-14 Constant Group Delay Note, how ever , tha t the p hase cha r acteristi c typicall y consists of both linea r and higher order (deviations from linear) comp onents . The line ar component c an be attr ibuted to the elec trical lengt h of the tes t device , and repres ents the aver ag[...]

  • Página 401

    7- 31 Operati ng Concepts Analyzer D i splay Formats Fi gu re 7-16 Rate of Phase Change V ersus Fre q ue nc y When deviatio ns from li near phase are p resent, changing the frequency step ca n result i n different values fo r group dela y . Note that i n this case the computed sl ope varies a s the aperture ∆ f is incr eased . See Fi gur e 7 -17 [...]

  • Página 402

    7- 32 Operating Concept s Anal yz er Displa y Formats The def a ult gro up delay a perture i s the fr eq uency span di vided by the num b er of poi nts across the display . T o set the ape r ture to a different v alue, tur n on smoothing in the av er age menu, and v ary the smoothing aperture . The aperture can be vari ed up to 2 0 % of the s p an [...]

  • Página 403

    7- 33 Operati ng Concepts Electrical Delay Electrical Delay The softkey adjusts the electri cal dela y to balance the phase of the test dev ice. T hi s softkey m ust be us ed in conj unc tion wit h or (with c ut-off f r equency) i n order to i d entify whi ch type of transmission l ine the d elay is b eing added t o. Thes e softkeys can b e accesse[...]

  • Página 404

    7- 34 Operating Concept s Noise Reduction T ec hniques Nois e Reductio n T echniq ues The key is used to a c cess thr ee d iff er ent noi se reduction tec hni ques: sweep-t o- sweep av er aging , displ ay smoothing , and var i able IF ba nd width. All of these can b e used simul ta neously . Averagi ng and smoothing c an be set i ndependently for e[...]

  • Página 405

    7- 35 Operati ng Concepts Noise R ed uction T echniques Smoothing Smoothing ( similar to video filter ing) avera ges the formatt ed acti v e channel d a ta over a portion of the dis played tra ce. Smoothi ng computes each display ed data point based on one sweep only , using a mov ing a v erage of sev eral adjacent d ata points f or the cu r rent s[...]

  • Página 406

    7- 36 Operating Concept s Noise Reduction T ec hniques Another d ifference b etween sweep-to- sweep averag ing and variable IF bandwidth i s the sweep ti me. A veraging di s plays the first c omplete tra c e faster b ut takes severa l sweeps to reac h a fully av eraged trac e. I F bandwidth reduc tion lowers the noise fl oor in one sweep , but th e[...]

  • Página 407

    7- 37 Operati ng Concepts Measurement Calibr ation Measurement Calibr atio n Measurement calibrati on is an a ccura cy enhancement procedure that effecti ve ly removes the syst em errors tha t cause uncer tainty i n m easuring a t est device. It meas ur es known standard dev ices, a nd uses the results of the s e measurem ents to c ha racterize the[...]

  • Página 408

    7- 38 Operating Concept s Measurement Calibr ation What Causes Measurement Errors? Network analysi s measurement errors ca n be separated into sy stematic , random, and drif t error s. Correct able systemati c er ror s are the repeatable errors that the system c an measure . These a r e errors due to mismatch and leakage in the test s etup, i s ola[...]

  • Página 409

    7- 39 Operati ng Concepts Measurement Calibr ation However , an actual coupler is no t per fec t, a s shown in Figure 7- 21 b. A smal l a mount of the incident signal appear s at the coupled output d ue to lea k age as wel l as reflec tion from t he termination in the coupled arm. Also, refl ections from the coupler output connec tor appear at the [...]

  • Página 410

    7- 40 Operating Concept s Measurement Calibr ation Load Match Load match error res ults from an imp erfect matc h at the outp ut of the t est device . It is caused b y impedance m ismatches bet ween the test d evice o utput port and p ort 2 of the measurement system. Some of the transmitted s ignal is r eflected fr om port 2 back to the test device[...]

  • Página 411

    7- 41 Operati ng Concepts Measurement Calibr ation Frequency Response (T rac king) This is the vector sum of all test setup variatio ns in which magnitude and phase change as a functi on of freque nc y . This i ncludes varia tions contr ibuted by signa l-separation d evices , test ca b les , adapters , and variatio ns between t he reference a nd te[...]

  • Página 412

    7- 42 Operating Concept s Measurement Calibr ation T o c ha racterize the er rors , the reflec tion coef f icient is measured by f irst separ a ting the inc ident si gnal (I) f rom the reflec ted s ig nal ( R) , the n taking the ratio of the tw o values . See Figu re 7 -25 . Ideally , (R) consists only of t he signa l reflected by the test device ([...]

  • Página 413

    7- 43 Operati ng Concepts Measurement Calibr ation This re-ref lection ef fect and the resulta nt incident powe r variation a re caused b y the source match error , E SF as show n in Figure 7- 27 . Figur e 7-2 7 S our ce Ma tch E SF Frequency response (tr a cking) er ror is ca us ed by varia tions in magnit ude and phase flatness versus frequenc y [...]

  • Página 414

    7- 44 Operating Concept s Measurement Calibr ation If the value of t hese three "E" errors and the measured test device resp onse were known for ea ch frequency , this e q uation could b e solved for S 11A to obtain the a ctual test d evice resp ons e. Bec ause each o f these err or s change s with fr equency , thei r values must b e know[...]

  • Página 415

    7- 45 Operati ng Concepts Measurement Calibr ation Fi gu re 7-30 Measu r e d Effec t ive Directivity Next, a short ci rcuit te r mination whos e response i s known to a very hi gh degree i s used t o establish a nother conditi on as shown in F ig u re 7- 31 . F igure 7-31 S hort Circuit T ermin ation The open c ircuit gives the third independent co[...]

  • Página 416

    7- 46 Operating Concept s Measurement Calibr ation Fi gure 7-32 Open C ir cuit T e rmination This compl etes the c alibration pr oc edure for one port d evices . Device Measurement Now the unknown i s measured t o obtain a v a lue for the measured resp onse, S 11M , at ea ch frequency . Ref er to Figu re 7-3 3 . Fi gure 7-33 Measured S 11 This is t[...]

  • Página 417

    7- 47 Operati ng Concepts Measurement Calibr ation Two-P ort Error Model (ES Models Only) The error mo d el for m easurement of the transmissi on coeffic i ents (magnit ude and phase) of a two-p ort device i s derived i n a similar m a nner . The potentia l sources of error are frequency r esponse ( tr acki ng), source match, loa d match, and isol [...]

  • Página 418

    7- 48 Operating Concept s Measurement Calibr ation As in t he reflection mo del, source match can cause the incident s ig nal to vary as a f unction of t es t device S 11 A . Als o, si nc e the te s t setup tr a nsmission r eturn port is never exac tly the charac teristic imp edance, some of the t r ansmitted signal is reflected f r om the tes t se[...]

  • Página 419

    7- 49 Operati ng Concepts Measurement Calibr ation NO TE It is very i mportant tha t the exact ele ctrical len gth of the thr u be known. Most calib r ation ki ts assume a zero l ength thru. F or some connecti on types such a s Type-N , this impl ies one mal e and one f emale port. If the test system requires a non-zero leng th thru, for ex ample, [...]

  • Página 420

    7- 50 Operating Concept s Measurement Calibr ation The anal yzer’s tes t set can meas ure both the fo rward and rev erse ch aract eris tics of the test devic e without you ha ving to manua l ly remove and physically r everse the dev ice. A f ull two-po r t error mo d el illus trated in Figu re 7-3 8 . This il lustr a tion depic ts how the analyze[...]

  • Página 421

    7- 51 Operati ng Concepts Measurement Calibr ation Fi gu re 7-39 Full Two-P ort Error Model Equations How Effective Is Accuracy Enhancement? In additi on to the er rors removed by accuracy enhanc em ent, other s y stematic er rors exist due to li mitations of d ynamic accur a cy , tes t set switch repeatability , and te s t cable stabili ty . These[...]

  • Página 422

    7- 52 Operating Concept s Measurement Calibr ation Figu re 7-4 0 a shows a measurement i n log magnit ud e format w ith a response c alibration only . Fi gur e 7 -40 b shows th e improvement in the same measurement using an S11 one-por t c a li bra tion. Figure 7-41 a shows the measurement on a Sm ith char t with re s pons e cali bration only , and[...]

  • Página 423

    7- 53 Operati ng Concepts Measurement Calibr ation The response of a devic e in a lo g m agnitude for mat is shown in Fig ure 7-4 2 . Figu re 7-4 2 a shows the response using a response calibrati on and Fi gure 7-42 b the response usi ng a ful l two-port c a libration. Fi gu re 7-42 Re spon se versus Fu l l Two-P ort Calibration[...]

  • Página 424

    7- 54 Operating Concept s Cali bration R outines Ca libr ati o n Ro ut in es There are tw elve diffe r ent error te rms for a tw o-port measurement tha t can be c or rected by accur acy enhanc ement in the anal yzer . These are dir ec ti vi ty , source match, load match , isola ti on, refle cti on trac king , and transmission tracki ng, each in bot[...]

  • Página 425

    7- 55 Operati ng Concepts Calib r atio n Routines Enh anc ed Ref lec tion Calibr ation The enhanced r eflection c a librat ion is activ a ted by s electing under the menu. The enhanced r eflection c a librat ion effecti v ely removes l oad match er r or from the enhanced res ponse calibr a tion perf or med on a bil ateral device . A bilatera l devi[...]

  • Página 426

    7- 56 Operating Concept s Cali bration R outines E-CAL The E-Cal calibrat i on menu is acti vated by pr essing in the c alibratio n menu. The E-Cal (Elec tronic Ca libration) system determi nes systemic err ors of the analyzer throug h a one-time connec tion of a n E-Cal module to the network a na lyzer ports . The random er r or of c onnector rep [...]

  • Página 427

    7- 57 Operati ng Concepts Modi fyi ng Calibrati on Ki ts M odi fying C alib ration K its Modifying ca libration ki ts is nec essary only i f unusual standa r ds (suc h as in TRL*) a re used or the very highest accuracy is required. Unless a calibr a tion kit mo d el is prov i ded with the ca libra tio n devices used, a s olid und erstand ing of er [...]

  • Página 428

    7- 58 Operating Concept s Modi fying Cali bration Kits Procedure The fol lowing steps a re used t o modify or def ine a use r kit: 1. Select the predefined ki t to be m odified. ( T his is not necessary f or defi ning a new calibration ki t.) 2. Define the standards: • Def ine which "type" of standard it is. • Def ine t he electrical [...]

  • Página 429

    7- 59 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • l eads to a menu for construct i ng a labe l for the user- modified cal kit. If a label is supplied , it will appear as one of the fi v e softkey c hoices in t he select c al kit menu. The a p proach is similar to defining a display title , except th at the kit l abel is limite d to ten c[...]

  • Página 430

    7- 60 Operating Concept s Modi fying Cali bration Kits After a standard number i s entered, s electi on of the standa r d type wil l present o ne of five menus f or entering the electri cal character istics ( model coeffi cients) cor r esponding to that stand a rd type, s uch as . These menus a re tailor ed to the cur rent type , so that onl y char[...]

  • Página 431

    7- 61 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • def ines the s ta ndard type as a transmission l ine of speci fi ed leng th, f or cali brating transmis sion measurements . • de f ines the standard type to be a loa d , but with a n arbi tr ary impedance ( different f rom system Z0) . — all ow s you to s pecify the ( arbi trary) impe[...]

  • Página 432

    7- 62 Operating Concept s Modi fying Cali bration Kits The fol lowing is a descriptio n of the s oftkeys l ocated within the specif y offset m enu: • all o ws you to spe c ify the o n e -way e le c trica l del ay fro m th e measurement (r eference) pl a ne to the standard, in sec onds (s). (In a transm ission standard, offset del ay is the delay [...]

  • Página 433

    7- 63 Operati ng Concepts Modi fyi ng Calibrati on Ki ts A class often c onsists of a si ngle standard, b ut may be composed of more than one sta ndard if band-l imited stand ards are us ed. F or example , i f ther e were two l oad sta nd ards—a fi xed load for low frequenci es, a nd a sliding load for high frequenci es —then that class would h[...]

  • Página 434

    7- 64 Operating Concept s Modi fying Cali bration Kits NO TE It is of ten simpler to keep the number o f standards p er clas s to th e b are minimum need ed (often one) to a v oid confu s ion during c alibration. Each c lass can be given a user -definab le label as d escribed under label cl ass menus . Standard s are assigned to a cl a ss simply by[...]

  • Página 435

    7- 65 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • allows y ou to enter the sta ndard numbers f or a TRL line o r mat ch c alibr ati on. Label Class Menu The label c lass menus a re used t o define meaning f ul label s for t he calibration c lasses . These then b ecome softkey la b els during a measurement ca libration. Labe ls can be up [...]

  • Página 436

    7- 66 Operating Concept s Modi fying Cali bration Kits Modifying and Saving a Calibration Kit from the Calibration Kit Selection Menu T o modify a c alibration kit from the cali b ration kit selection menu, pr ess : T o sav e the modified calibration ki t, press: or Ensure that is underlined b ef ore sav ing the modifi ed user kit. Cal CAL KIT SELE[...]

  • Página 437

    7- 67 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) TRL*/LRM* Calibration ( ES Models On ly) The network anal y zer has the capabilit y of making cali b rations us ing the " TRL " (thru-ref lec t- l ine) method. This section contains infor mation on the following subjects: • Why Use TRL Ca l ibration? • TRL T erminolog[...]

  • Página 438

    7- 68 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) TRL T erminology Notice that the let ters TRL, LRL, L RM, etc. are often interchanged, depending on the stand a rds used. F or example, "LRL" indica tes that two l ines and a r eflect stand a rd are used; " TRM" indicates that a thru, r eflection a nd match stan[...]

  • Página 439

    7- 69 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) Also notic e that the f o rwar d source m atch (E SF ) and rev erse lo a d ma tch (E LR ) are both represented by ε 11 , while the reverse source match ( E SR ) an d forward lo ad match (E LF ) ar e both repres ented by ε 22 . In or der to solve for these ei ght unknown TRL error[...]

  • Página 440

    7- 70 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) Fi gure 7-44 8-term TRL (or TRL*) Error Model an d General ized Coe fficients S our ce ma tch a nd l oad matc h A TRL cal ibrati on a ssum es a pe rfec tl y b ala nced t est set arc hit ect ure as s how n b y t he ter m which represents b oth the forw ard source match (E SF ) and r[...]

  • Página 441

    7- 71 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) Improving Ra w Sourc e Match and Load Match for TRL*/LR M* Calibration A techn ique that c an be u s ed to i m prove the raw test port mismatc h is to add high q uality fixed attenuato rs . The effecti ve matc h of the s ys tem is improved because the fixed attenuators us ually ha [...]

  • Página 442

    7- 72 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) Transmi s sion mag nitude uncertaint y = E X + E T S 21 + E S S 11 S 21 + E L S 22 S 21 where: E D = ef fe ctiv e dir ec t iv ity E R = effe ctive r eflect ion tracking E S = ef fective sour ce match E L = eff ective load match E X = effect i ve cro s st alk E T = ef fect ive t ran[...]

  • Página 443

    7- 73 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) • Attenuati on of the thr u need not be know n. • If the thru is use d to set t he reference p lane, the inser tion phase or electri cal length must be well-known and specif ied. If a non-zero length thru is specified to have zero delay , the r efer ence plane is established in[...]

  • Página 444

    7- 74 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) F abricating and defining calibration stand ard s for TRL/LRM When cal ibrating a net w ork analyzer , the ac tua l ca l ibration s tandards must have known physical characteristi cs. F or the re flect standard, thes e characteri stics incl ude the offset in elec trical del ay (sec[...]

  • Página 445

    7- 75 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) where: f = frequency l = length of l ine v = v elocity = speed of l ight × velocity factor which can be reduced to the follo wi n g using fr equenci es in MHz a nd len gth in centi meters : So for a n air line (velocity f actor appr oximately 1) a t 1000 MHz, t he insertion pha s [...]

  • Página 446

    7- 76 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) The TRM cali bration tec hnique is related to TRL with the difference b eing that i t bases the charac teristic imp edance of the measurement on a matched Z O terminati on instead of a transmiss ion line f or the thi rd measurement stan d ard. Like the TRL thru sta nd ard, the TRM [...]

  • Página 447

    7- 77 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) The location of the ref erence plane is determine d by the selec tion of and . By def a ult, the refer enc e pla ne i s set w ith the thru sta ndard whic h must have a known inserti on phase or elec trical leng th. If a non-zero le ngth thru is specified to have ze ro delay , the r[...]

  • Página 448

    7- 78 Operating Concept s GPI B Op e ra t ion GPIB Operat i on This sec tion conta i ns infor ma tion on the following t op ics: • l ocal ke y • GPIB control ler modes • instrument a d dresses • using the pa rallel por t Key This key is allo w s you to retur n the analyzer to local ( front pa nel) operation from remote (computer controlled [...]

  • Página 449

    7- 79 Operati ng Concepts GPIB Ope ra t io n GPIB ST A TUS Indicato rs When the anal yzer is con nec ted to ot her instruments over GPIB , the G P IB STA TUS indicator s in the ins trument state function bloc k light up to d isplay the current s tatus of the analyze r . R = r em ote operati on L = listen mode T = talk mode S = s ervice r equest (SR[...]

  • Página 450

    7- 80 Operating Concept s GPI B Op e ra t ion Address Menu This menu c an be accessed b y pressing the softkey withi n the GPIB menu. In c om m unications through the General Purpos e Inter face Bus (GPIB) , each ins trument on the b us is identi fied by a G P IB address . This d ec imal-based a ddress code m ust be differ ent for eac h instru m en[...]

  • Página 451

    7- 81 Operati ng Concepts GPIB Ope ra t io n The GPIO M ode The GPIO mode tur ns the parallel port into a "general p urpose input/o utp ut" por t. In this m od e the por t can be c onnec ted to t est fixtur es, p ow er suppli es, and other peripheral equipment that might be us e d to i nter act with the ana ly zer during measurements . Th[...]

  • Página 452

    7- 82 Operating Concept s Limit Line Oper ation Limit Line Operation This menu c an be accessed b y pressing withi n the system menu. Y ou can have limit lines d rawn on the display to represent upper an d lower limits or devic e spec i ficatio ns with which t o compa re the tes t device . Limits a re defi ned in se gm ents , where each seg m ent i[...]

  • Página 453

    7- 83 Operati ng Concepts Limit Line Oper ation If limit l ines are on, the y are plotted with t he d ata on a plot. If limit testing i s on, the PAS S or FAIL message is plotted, and the failing por tions of the trace tha t are a different col or on the displ ay are also a differ ent color on the plot. If limit s are spec ified, they a re sav ed i[...]

  • Página 454

    7- 84 Operating Concept s Know ing the I nstrument M odes Knowin g the Instru ment Mod e s There are thre e major instr ument modes of the analy zer : • network analyzer m ode • tuned rec eiver mode • frequency of fset opera tion (Option 089) Network Analyzer Mode This i s the standa r d mode of op er ation for the analyzer , and i s active a[...]

  • Página 455

    7- 85 Operati ng Concepts Know ing the I nstrument M odes Fi gu re 7-46 Typical T est Setup for T un ed Receiver Mode Tuned Re ceive r Mo de I n-De pth D es cript ion If you press , the analyz er receiver operates i ndependently of any signal s ource . The foll ow ing featur es and limitati ons apply to the tuned receiver m ode: • It is a f ully [...]

  • Página 456

    7- 86 Operating Concept s Know ing the I nstrument M odes[...]

  • Página 457

    8-1 8 Safet y an d Regu latory Infor mati on[...]

  • Página 458

    8-2 Saf ety and Regulatory I nf or mation Gene r al Info r mat ion General Inf ormation Maintenance Clean the cabinet, using a dry or d amp cloth only . W ARNI NG T o prevent electrical sh ock, d isc on nect the analyzer fr om m ains before cleanin g. Use a dry c loth or o ne slightly damp ened w ith wat er to clea n the exte rnal case parts. Do no[...]

  • Página 459

    8- 3 Saf et y and Regulator y Inf orm ation G e ne r a l In for ma t io n T ab le 8-1 C ontact ing Ag ilent Online ass istance: www.agilent.com/f ind/assist Un i ted S tat es (tel) 1 800 452 48 44 Latin A meric a (tel) (305) 269 7500 (fax) (305) 269 7 599 Canada (tel) 1 87 7 894 4 414 (fax) ( 905) 282-6 495 Eu rope (tel) (+31 ) 20 547 2323 (fax) (+[...]

  • Página 460

    8-4 Saf ety and Regulatory I nf or mation Sa fety S ym bol s Sa fety Sym b o ls The fol lowing safety symbols are u s ed throughout this manual. F amiliari ze yourself wi th each of the symbol s and its meani ng before op erating thi s instrument . CA UTI ON Cauti on denotes a ha zard. It c a lls atte ntion to a pr ocedure that, if not correctl y p[...]

  • Página 461

    8- 5 Saf et y and Regulator y Inf orm ation Saf ety C onsi der ati ons Saf ety Cons idera tions NO TE T his instrume nt has been designe d and teste d in accordance w i th IEC Publication 1010, Safety Requirements for Electr onics Measuring Apparatus , and has b een supplied in a s afe conditi on. This i nstruction d ocumentation contains i nformat[...]

  • Página 462

    8-6 Saf ety and Regulatory I nf or mation Safet y Consi der ati ons Servicing W ARNI NG No operator se rviceable parts inside. Refer servic ing to qualified perso nnel. T o pr even t electr ic al s ho ck, do no t r em ove cov e rs. W ARNI NG The se servicin g in stru c t ions a re for use by qualified person n el only . T o avoid electrical shock, [...]

  • Página 463

    8- 7 Saf et y and Regulator y Inf orm ation Saf ety C onsi der ati ons General W A RNING T o p revent electrical shock, d isconnect the analyzer from mains before cl eaning. Use a d ry c loth or one slight ly dampened with wat er to clean the exte rn al c ase part s. Do not attempt to cle an internal ly . W A RNING If this product is not used as sp[...]

  • Página 464

    8-8 Saf ety and Regulatory I nf or mation Safet y Consi der ati ons Compliance with German FTZ Emissions Requirements This ne twork analyzer compl ies with German F T Z 526/527 Radia ted Emissions a nd Conducted Em ission req uirements . Compliance with German Noise Requirements This i s to decl are that thi s instrumen t is in confor mance with th[...]

  • Página 465

    8- 9 Saf et y and Regulator y Inf orm ation Decl arat i on of Conf ormity Declarat i on of Confo rmity[...]

  • Página 466

    8-10 Saf ety and Regulatory I nf or mation Decl arat i on of Conf ormity[...]

  • Página 467

    Index In dex - 1 Numerics 2-por t error co rrecti o ns , pe rfor ming , 6-42 , 6- 71 4 Par am Disp lays soft ke y , 1- 18 A aborting a print or pl ot proc ess , 4-33 absolut e ripple t est value , 1-88 , 1- 8 9 absolut e power , 6-39 accurac y enhancem ent , 7- 7 , 7-37 , 7-51 accurat e measurem ent s of electrica lly long de vices cause of meas ur[...]

  • Página 468

    In dex - 2 Index TRL*/LRM * two-por t cal ib ra tio n , 7- 55 cal ib rat ion s tan d ard s , 6- 5 cal ib ra tio n t ech n iqu es improp er , 5- 4 cal i b ra t io n , me a su r em en t , 7-37 cal i b ra t io n , re c e ive r , 6-15 calibr ation, TRL*/LRM* , 7-67 callin g the next measurement seque nc e , 2-30 capab ilities mixer measur ement , 2-3 c[...]

  • Página 469

    Index In dex - 3 tit lin g , 1- 11 ad ju s t in g co l o rs of th e di spl a y , 1-22 blanking the dis play , 1-21 d a ta tr a ce savin g to di splay mem ory , 1-19 four -channel d isplay 4 P aram Di spl a ys so ft k e y , 1-18 Ch anne l P ositio n so ftke y , 1-17 cus tomizing , 1-1 7 viewing , 1-14 measu rement d ata divi din g b y t he m emo ry [...]

  • Página 470

    In dex - 4 Index flat limit lines , 1- 73 f loppy dis k, what you can sa ve , 4- 37 form feed se quen ce , 4-26 sending to the printer , 4-2 6 for ma t , 7-8 form at a rray s , 7- 8 for ma t m a rk er s, pol a r , 1-3 2 format s, analy z er display , 7-24 form at ting a disk , 4- 54 forw ard stepping in edi t mode , 1-106 for ward tr ans fo rm mea [...]

  • Página 471

    Index In dex - 5 improving raw sourc e match and load matc h for TRL*/ LRM* cal ibration , 7-7 1 in crea se s weep sp eed using fast 2-port c alib ration , 5-13 increas ing dynamic rang e , 5- 15 incr easin g te st po rt in put pow er , 5-15 reducin g rece iver cros stalk , 5-15 reducin g t he receiver no ise flo or , 5-15 increas ing meas urem ent[...]

  • Página 472

    In dex - 6 Index li ne se gmen ts, ed itin g , 1- 78 delet ing line s egments , 1- 78 li ne type s, sel ecting , 4- 17 li near freq uency sweep , 7-1 5 linear magnitude format , 7-27 li near phas e, de v iatio n , 1-46 li near sw eep , 1-55 li near ity , ph ase , 2-35 li st val ues , pr inting or plot ting , 4- 34 LO fr equency a ccur acy and sta b[...]

  • Página 473

    Index In dex - 7 insert ion pha se response , 1-7 , 1-8 separ ate trans missi o n paths throug h the te s t dev ic e using l ow pass impul s e mo de , 3-20 small signal tr ansient res pon se usi ng low pa ss ste p , 3-19 measuring am pli fiers , 1-5 2 high power mea s urements , 1-65 high power mea s urements ma ki ng , 1-59 measuring gain and reve[...]

  • Página 474

    In dex - 8 Index stor ing the HPGL initia lizat ion seq uenc e , 4-25 P pag e quad rants , plotti ng mea sur ements in , 4-30 par am ete rs lowe r st op band , 1-69 me a sur em en t , 1-4 , 1- 68 , 6-4 passban d , 1-69 upper stopba nd , 1-69 pas s contro l mod e , 7-79 pass ban d p ara met ers , 1-6 9 PC interf ace uni t , 6- 59 PC , to view files [...]

  • Página 475

    Index In dex - 9 scale and off set , 7- 8 smoothing , 7-8 sweep- to-swe ep a veragin g , 7- 6 tra ce ma th op eration , 7- 7 tra nsform , 7-8 vect or error -corr ection , 7- 7 pr ocess ing , d ata , 7- 5 prompt ing user to connect mixer te st set up , 2-29 purging a seque nce from a disk , 1-104 R R channel inputs , internal and exte rnal , 2-10 ra[...]

  • Página 476

    In dex - 10 Index pl a c es wh e r e you ca n sav e , 4-36 what you ca n sa v e t o a com p ute r , 4-37 what you ca n sa v e t o a f loppy disk , 4- 3 7 what you can sa v e to the an alyzer’ s intern al memory , 4-36 savi ng measure ment re s ults ASCII data for m ats , 4-41 inst rume n t sta te file s , 4-47 scal e and offs et , 7-8 scal e, ch [...]

  • Página 477

    Index In dex - 11 swept edit lis t menu , 7-17 swept ed it subs weep me nu , 7-17 swept list mode cali brate , 1- 70 charact erist ics of th e filt er , 1- 68 devic e unde r test, conn ect , 1-6 7 me asu re , 1-70 measu rement p arameter s , 1-68 s tep pe d lis t mo de , 1- 67 to te st a dev ice , 1-67 swept lis t mode , using , 5-10 s wept RF/I F [...]

  • Página 478

    In dex - 12 Index creat ing a user -def ine d TRL cal ib rat ion k it , 6- 50 TRL optio ns , 7-76 TRL terminolo gy , 7- 68 TRL* er ror mod el , 7-6 8 TRL*/LRM* cali br at ion , 7-6 7 fabri cating an d defini ng cal ib rat ion s tan d ard s f or TRL/LRM , 7- 7 4 how TRL*/LRM* works , 7-68 impr oving ra w source mat ch and load matc h for TRL*/LRM* c[...]